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SLLU298 – May 2018
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Copyright © 2018, Texas Instruments Incorporated
ISO5852SDW Driving and Protecting SiC and IGBT Power Modules
User's Guide
SLLU298 – May 2018
ISO5852SDW Driving and Protecting SiC and IGBT Power
Modules
This user's guide describes the characteristics, operation, and use of the ISO5852SDWEVM-017
Evaluation Module (EVM). This TI EVM provides driving and protection for popular Silicon Carbide (SiC)
MOSFET and Si IGBT Power Modulues. A complete schematic diagram, printed-circuit board layouts, and
bill of materials are included in this document.
Contents
1
Overview
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3
1.1
Features
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3
1.2
Applications
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3
1.3
Description
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4
2
Test Setup and Results
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9
2.1
Before You Begin
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9
2.2
Equipment
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10
3
Board Layout
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18
4
Schematic and Bill of Materials
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25
4.1
Schematic
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25
4.2
Bill of Materials
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31
List of Figures
1
ISO5852SDWEVM-017 EVM Block Diagram
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6
2
ISO5852SDWEVM-017 Top View
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8
3
ISO5852SDWEVM-017 Mounted on Top of Power Module
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9
4
Power Up and Bias Supply Voltages VU and VL Test Setup
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11
5
Test Setup for Input and Output Switching Waveforms
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12
6
Major Input and Output Waveforms Using Output Overlapping Prevention Feature
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14
7
Thermistor Amplifier Test Setup
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15
8
Input Bus Voltage Sense Amplifier Test Setup
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9
Safety Isolated Regions between High and Low Voltage Board Areas
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10
Top View of the Board
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18
11
Bottom View Of The Board
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12
Component Placement
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13
Top Layer
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21
14
Signal Layer 1
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15
Signal Layer 2
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23
16
Bottom Layer
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17
Electrical Schematic of ISO5852SDWEVM-017
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26
18
Electrical Schematic with Functional Blocks Outlined
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27
19
Waveforms with Overlapping Enabled
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28
20
Rise Time and Propagation Delay Waveforms with 10 nF Load
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29
21
Fall Time and Propagation Delay Waveforms with 10 nF Load
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30
List of Tables