5
DLPU016C – April 2014 – Revised April 2019
Copyright © 2014–2019, Texas Instruments Incorporated
Read This First
Preface
DLPU016C – April 2014 – Revised April 2019
Read This First
The DLP
®
NIRscan™ EVM is a third-party implementation of the next generation DLP reference design to
enable faster development cycles for spectrometer applications requiring small form factors.
Trademarks
NIRscan, Sitara are trademarks of Texas Instruments.
DLP is a registered trademark of Texas Instruments.
Safari is a registered trademark of Apple Inc.
Digi-Key is a registered trademark of Digi-Key Corporation.
Google is a trademark of Google Inc.
Internet Explorer is a registered trademark of Microsoft Corporation.
Mozilla Firefox is a registered trademark of Mozilla Corporation.
Sullins Connector Solutions is a registered trademark of Sullins Connector Solutions, Inc.
About This Guide
This guide is an introductory document for the DLP NIRscan EVM that provides an overview of the system
and the systems software. Other documents provide more in-depth information of the hardware and
software features of the components of the DLP NIRscan EVM.
This document covers DLP NIRscan Software version 2.0 - version 2.0 is an update to version 1.0 which
adds the Slew Scan mode and Custom Scan - Hadamard mode of operation. For instructions on how to
update the NIRscan software from version 1.0 to version 2.0, please see Appendix C of this document.