6.8 Electrical Characteristics: General
at 1.7 V ≤ V
DD
≤ 5.5 V, DAC reference tied to VDD, gain = 1x in voltage output mode or ±250-µA output range in current
output mode, DAC output pin (OUT) loaded with resistive load (R
L
= 5 kΩ to AGND) in voltage-output mode and capacitive
load (C
L
= 200 pF to AGND), digital inputs at VDD or AGND, and all minimum and maximum specifications at
–40°C ≤ T
A
≤ +125°C and typical specifications at T
A
= 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
INTERNAL REFERENCE
Initial accuracy
T
A
= 25°C
1.1979
1.212
1.224
V
Reference output temperature
coefficient
50
ppm/°C
EXTERNAL REFERENCE
V
REF
192
kΩ/ch
EEPROM
Endurance
–40°C ≤ T
A
≤ +85°C
20000
Cycles
T
A
= 125°C
1000
T
A
= 25°C
50
Years
EEPROM programming write
cycle time
200
ms
Device boot-up time
Time taken from power valid (V
DD
≥ 1.7 V) to output
valid state (output state as programmed in EEPROM),
0.5-µF capacitor on the CAP pin
5
ms
DIGITAL INPUTS
Digital feedthrough
Voltage output mode, DAC output static at midscale,
fast mode plus, SCL toggling
20
nV-s
Pin capacitance
Per pin
10
pF
POWER-DOWN MODE
I
DD
Current flowing into VDD
DAC in sleep mode, internal reference powered down,
external reference at 5.5 V
28
µA
DAC in sleep mode, internal reference
enabled, additional current through internal reference
10
DAC channels enabled, internal reference enabled,
additional current through internal reference per DAC
channel in voltage-output mode
12.5
HIGH-IMPEDANCE OUTPUT
I
LEAK
Current flowing into V
OUTX
and
V
FBX
DAC in Hi-Z output mode, 1.7 V ≤ V
DD
≤ 5.5 V
10
nA
V
DD
= 0 V, V
OUT
≤ 1.5 V, decoupling capacitor between
V
DD
and AGND = 0.1 μF
200
V
DD
= 0 V, 1.5 V < V
OUT
≤ 5.5 V, decoupling capacitor
between V
DD
and AGND = 0.1 μF
500
100 kΩ between V
DD
and AGND, V
OUT
≤ 1.25 V, series
resistance of 10 kΩ at OUTx pin
±2
µA
(1)
Specified by design and characterization, not production tested.
(2)
Measured at –40°C and +125°C and calculated the slope.
(3)
Impedances for the DAC channels are connected in parallel.
SLASF47 – MAY 2022
Copyright © 2022 Texas Instruments Incorporated
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