6.7 Electrical Characteristics: Comparator Mode
at 1.7 V ≤ V
DD
≤ 5.5 V, DAC reference tied to VDD, gain = 1x in voltage output mode, DAC output pin (OUT) loaded with
resistive load (R
L
= 5 kΩ to AGND) and capacitive load (C
L
= 200 pF to AGND), digital inputs at VDD or AGND, and all
minimum and maximum specifications at –40°C ≤ T
A
≤ +125°C and typical specifications at T
A
= 25°C (unless otherwise
noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
STATIC PERFORMANCE
1.7 V ≤ V
DD
≤ 5.5 V, DAC at midscale, comparator
input at Hi-Z, and DAC operating with external
reference
–5
0
5
mV
Offset error time drift
V
DD
= 5.5 V, external reference, T
A
= 125°C, FBx in
Hi-Z mode, DAC at full scale and V
FB
at 0 V or DAC
at zero scale and V
FB
at 1.84 V, drift specified for 10
years of continuous operation
4
mV
OUTPUT
Input voltage
VREF connected to VDD, FBx resistor network
connected to ground
0
V
DD
V
VREF connected to VDD, FBx resistor network
disconnected from ground
0
V
DD
(1/3 – 1/100)
V
OL
Logic low output voltage
I
LOAD
= 100 μA, output in open-drain mode
0.1
V
DYNAMIC PERFORMANCE
t
resp
Output response time
DAC at midscale with 10-bit resolution, FBx input at
Hi-Z, and transition step at FBx node is
(V
DAC
– 2 LSB) to (V
DAC
+ 2 LSB), transition time
measured between 10% and 90% of output, output
current of 100 µA, comparator output configured in
push-pull mode, load capacitor at DAC output is
25 pF
10
µs
(1)
Specified by design and characterization, not production tested.
(2)
This specification does not include the total unadjusted error (TUE) of the DAC.
SLASF47 – MAY 2022
8
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