Texas Instruments bq24165, Руководство пользователя

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Test Summary
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2 Test Summary
This procedure describes one test configuration of the HPA741 evaluation board for bench evaluation.
2.1 Definitions
The following naming conventions are followed.
VXXX : External voltage supply name (VIN, VUSB)
LOAD#: External load name
V(TPyyy): Voltage at internal test point TPyyy. For example, V(TP12) means the voltage at
TP12.
V(Jxx): Voltage at header Jxx
V(TP(XXX)): Voltage at test point XXX. For example, V(ACDET) means the voltage at the test
point which is marked as ACDET.
V(XXX, YYY): Voltage across point XXX and YYY.
I(JXX(YYY)): Current going out from the YYY terminal of header XX.
Jxx(BBB): Terminal or pin BBB of header xx
JPx ON : Internal jumper Jxx terminals are shorted.
JPx OFF: Internal jumper Jxx terminals are open.
JPx (-YY-) ON: Internal jumper Jxx adjacent terminals marked as YY are shorted.
Measure: → A,B Check specified parameters A, B. If measured values are not within specified limits
the unit under test has failed.
Observe → A,B Observe if A, B occur. If they do not occur, the unit under test has failed.
Assembly drawings have location for jumpers, test points, and individual components.
2.2 Recommended Test Equipment
2.2.1 Power Supplies
1. Power Supply number 1 (PS1) capable of supplying 6 V at 3 A is required.
2. If not using a battery as the load, then power supply number 2 (PS2) capable of supplying up to 5 V at
5 A is required to power the circuit shown in Figure 2 .
2.2.2 Load #1 between BAT and GND
Testing with an actual battery is the best way to verify operation in the system. If a battery is unavailable,
then a circuit similar to the one shown in
Figure 2 can simulate a battery when connected to a second
power supply.
6 Chipscale-Packaged bq24165, 24166, 24167 Evaluation Modules SLUU497B – December 2011 – Revised June 2012
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