Basic Test Procedure
13
SLAU455B – August 2012 – Revised May 2016
Copyright © 2012–2016, Texas Instruments Incorporated
ADS58H4x (ADS58H40/ADS58H43) EVM
8. Press the
Capture
button on the High Speed Data Converter Pro GUI.
Observe an FFT result similar to that of
Figure 11. ADS58H4x 11-bit Operating Mode, Single Tone Test Result: Fs = 245.76 MSPS, Fin = 170 MHz
If the basic capture at this point is correct, then the front panel options of the SPI GUI and the front panel
options of the TSW1400 GUI may be varied. The two examples below show the 11-bit SNRBoost mode
and the 14-bit High Resolution Burst Mode.
Single tone FFT test (ADS58H4x 11-bit SNRBoost Mode)
1. Select the ADS58H40-11b device.
2. After selecting Single Tone FFT Test under
Test Selection
, enter the sample rate, input frequency, and
the number of samples.
3. Select channel A, B, C, or D depending on which channel is connected to the signal generator.
4. To enable the SNRBoost Mode, set the JP9 connector to 1-2 position or enable
SNRBoost Pin
Override
in the ADS58H40 GUI. Also, in the ADS58H40 EVM GUI, disable High Resolution Burst
Mode of the channels under evaluation since High Resolution Burst Mode takes precedence over
SNRBoost Mode.
5. Press the
Capture
button on the High Speed Data Converter Pro GUI.
6. Observe an FFT result similar to that of
7. Select
Bandwidth Integration Markers
option under
Test Options
to set the proper integration
calculation for SNR. Set the bandwidth integration markers, BM0 and BM1, by either dragging the
markers on the FFT screen or by entering the frequency location at the lower left-hand side of the High
Speed Data Converter GUI.
