Tektronix P6136, Инструкция по эксплуатации

Страница: 16 / 30

Service Information
10
P6136 Instruction Manual
Table 5: Test equipment (cont.)
Description Example product Minimum requirements
Adapters
Subminiature tip Subminiature-to-BNC, 50
W
terminated
Adapter, BNC-to-probe
Tektronix 001-0049-XX
Tektronix 013-0195-XX
Compact tip Compact-to-BNC, 50
W
terminated
BNC-female-to-BNC-female
Tektronix 013-0227-XX
Tektronix 103-0028-00
Adjustment tool Insulated, low-reactance type Tektronix 003-1433-02
NOTE
. To ensure accurate measurements, warm up all test equipment according
to the manufacturer’s recommendations before making any adjustments.
To adjust the probe low-frequency compensation do the following:
1. Connect the P6136 probe to the oscilloscope CH 1 input.
2. Set the oscilloscope controls for 100 mV (includes probe 10X attenuation),
1 ms, and DC coupling.
3. Use the hook tip to connect the probe to the oscilloscope calibrator output.
4. Set the oscilloscope triggering and amplitude controls for a stable display of
approximately five square wave cycles and an amplitude of four divisions at
center screen.
5. Use the low-reactance nonconductive adjustment tool to adjust the probe
LF COMP (low-frequency compensation) for the squarest waveform front
corner edge. See Figure 9 for the adjustment location.
6. Disconnect the test setup.
To adjust the probe high-frequency compensation do the following:
1. Connect the positive-going fast-rise output of the calibration generator to the
test oscilloscope with the precision coax cable and 10X attenuator.
2. Set the oscilloscope controls as follows:
Volts /Division 10 mV (includes 10X probe attenuation)
Time/Division 0.02
m
s
Low-Frequency
Compensation
Adjustment
High-Frequency
Compensation
Adjustment