K850
1203-2528 rev. 1
MEASUREMENT POINTS
Test
ME
A
S
U
R
EMEN
T
P
O
IN
T
S
Made for
Document Nr
Revision
SP5101 SP5102 SP5103 SP5104 SP5105
SP5107
SP5106
SP5108
SP5109
SP5110
SP5111
SP5112
SP5113
SP5114
SP5115
SP5116
SP5117
SP5118
SP5119
SP5120
ASTA/ANJA
N3
N2
M2
M3
A21
A1
M1
P1
D2000
1200-0795
ASTA/ANJA_JTAG
TDI
TMS
TRSTn
TCK
TEMU0n
TEMU1n
TDO
RTCK
Asta/Anja_TEST
JTAG_EMULATION_IF
ASTA/ANJA
8
1
G
9
L
V6
D2000
1200-0795
ASTA/ANJA_UNUSED
EFUSE_HV4
Asta/Anja_NOT_USED
UNUSED
ASTA/ANJA
D6
A5
C6
B6
A8
D8
C8
D7
B8
C7
B7
A6
D5
D2000
1200-0795
ASTA/ANJA_ETM
ETM_TCLK
ETM_TSYNC
ETM_TPKT0
ETM_TPKT1
ETM_TPKT2
ETM_TPKT3
ETM_TPKT4
ETM_TPKT5
ETM_TPKT6
ETM_TPKT7
ETM_PSTAT0
ETM_PSTAT1
ETM_PSTAT2
Asta/Anja_TEST
EMBEDED_TRACE_IF
ASTA/ANJA
D2000
R21
1200-0795
ACCESS_GPIO23
ACCESS_GPIO23
ASTA/ANJA
D2000
N19
1200-0795
APPLICATION_GPIO09
APPLICATION_GPIO09
ASTA/ANJA
D2000
M21
1200-0795
APPLICATION_GPIO06
APPLICATION_GPIO06
ASTA/ANJA
D2000
N20
1200-0795
APPLICATION_GPIO08
APPLICATION_GPIO08
ASTA/ANJA
D2000
T4
1200-0795
ACCESS_GPIO13
ACCESS_GPIO13
ASTA/ANJA
D2000
R2
1200-0795
ACCESS_GPIO10
ACCESS_GPIO10
10Kohms
R5100
100Kohms
R5101
TEMU1n low enables JTAG.
Unused GPIO
Test
Test
1200-1891 Page 1
3
SEMC Troubleshooting Manual
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