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Si5310-EVB

Rev. 0.71

3

Figure 1. MULTSEL Jumper Configurations

Loss-of-Lock (LOL)

LOL is an indicator of the relative frequency between
the REFCLK input, which is nominally a multiple of
CLKIN, and an internally generated multiple of CLKIN.
LOL will assert when the frequency difference is greater
than ±600 PPM. In order to prevent LOL from de-
asserting prematurely, there is hysterisis in returning
from the out of lock condition. LOL will be de-asserted
(indicating a lock condition) when the frequency
difference is less than ±300 PPM.

LOL is wired to a test point which is located on the

upper right-hand side of the evaluation board.

Test Configuration

The characterization of clock sources typically involves
measuring the output jitter or phase noise of the source.
The overall output jitter is a function of the input jitter
(jitter transfer) and the jitter generated (output jitter) by
the internal PLL.

Jitter can be measured using several different
techniques and hardware. An oscilloscope, a spectrum
analyzer, and a phase-noise analyzer are three such
instruments capable of measuring output jitter. A
spectrum analyzer is the best choice for measuring jitter
transfer.

Output Jitter

Output jitter is a measure of the output clock short-term
stability. In Figure 2, either position A or B can be used
when measuring this parameter.

Oscilloscope

An oscilloscope can measure jitter from the clock edges
within the trigger-to-capture bandwidth. Typically the
jitter measured is expressed in picoseconds (peak-to-
peak and RMS) relative to the average edge position. A
histogram can be used to capture the jitter distribution.

Table 1. CLKIN, CLKOUT, MULTOUT, REFCLK Operating Ranges

MULTSEL CLKIN 

Range 

(MHz)

REFCLK = 2

n

 x CLKIN 

±100 ppm

(see Note 2)

CLKOUT

MULTOUT

0

(MULTOUT = 600–668 MHz)

37.500–41.750

n = –2, –1, 0, 1, or 2

1xCLKIN

16xCLKIN

75.000–83.500

n = –3, –2, –1, 0, or 1

1xCLKIN

8xCLKIN

150.000–167.000

n = –4, –3, –2, –1, or 0

1xCLKIN

4xCLKIN

300.000–334.000

n = –5, –4, –3, –2, or –1

1xCLKIN

2xCLKIN

600.000–668.000

n = –6, –5, –4, –3, or –2

See Note 1

1xCLKIN

1

(MULTOUT = 150–167 MHz)

9.375–10.438

n = 0, 1, 2, 3, or 4

1xCLKIN

16xCLKIN

18.750–20.875

n = –1, 0, 1, 2, or 3

1xCLKIN

8xCLKIN

37.500–41.750

n = –2, –1, 0, 1, or 2

1xCLKIN

4xCLKIN

75.000–83.500

n = –3, –2, –1, 0, or 1

1xCLKIN

2xCLKIN

150.000–167.000

n = –4, –3, –2, –1, or 0

See Note 1

1xCLKIN

Note:

1.

The CLKOUT output is not valid for MULTOUT:CLKIN ratios of 1:1 (MULTOUT = 1 x CLKIN.)

2. 

The REFCLK input can be set to any one of the five CLKIN multiples indicated. The REFCLK input can be 
asynchronous to the CLKIN input, but must be within ±100 ppm of the stated CLKIN multiple.

GN

D

2.

5 V

M ULTSEL

Low  Range

15 0–167 MHz

GN

D

2.

5 V

M ULTSEL

High Range

60 0–668 MHz

MU L TSEL

PWR D N /
C AL

MU LTSEL

PWR D N /
C AL

Содержание Si5310-EVB

Страница 1: ...s Si5310 precision clock multiplier regenerator IC All high speed I Os are AC coupled to ease interfacing to industry standard test equipment Features Single 2 5 V power supply Differential I Os ac coupled Simple jumper configuration Function Block Diagram REFCLK ZC 50 ZC 50 ZC 50 ZC 50 CLKIN CLKOUT MULTOUT ZC 50 ZC 50 ZC 50 ZC 50 Pulse Generator Freq Synth Spectrum Analyzer Scope Spectrum Analyze...

Страница 2: ...t signal post between 2 5 V and GND CLKIN CLKOUT MULTOUT These high speed I Os are wired to the board perimeter on 30 mil 0 030 inch 50 microstrip lines to the end launch SMA jacks as labeled on the PCB These I Os are AC coupled to simplify direct connection to a wide array of standard test hardware Because each of these signals are differential both the positive and negative terminals must be ter...

Страница 3: ... short term stability In Figure 2 either position A or B can be used when measuring this parameter Oscilloscope An oscilloscope can measure jitter from the clock edges within the trigger to capture bandwidth Typically the jitter measured is expressed in picoseconds peak to peak and RMS relative to the average edge position A histogram can be used to capture the jitter distribution Table 1 CLKIN CL...

Страница 4: ...ides a RMS jitter value Jitter Transfer Jitter transfer is the ratio of the input jitter spectrum to the output jitter spectrum Comparing the power levels from the input jitter spectrum with the output jitter spectrum provides the jitter transfer details To characterize this parameter a modulation source is added to the synthesizer The FM modulation frequency is the jitter frequency and its relati...

Страница 5: ... tantalum 10uF C5 0603 0 1uF U5 Si5310 6 12 13 16 17 20 19 15 9 10 4 5 1 2 7 11 3 8 18 14 LOL CLKOUT CLKOUT MULTOUT MULTOUT NC MULTSEL PWRDN CAL CLKIN CLKIN REFCLK REFCLK REXT VDDA VDDB VDDC GNDA GNDB GNDC VDDD JP1 C3 0603 0 1uF J9 MKDSN 2 5 3 5 08 1 2 POS1 POS2 J7 JC 142 0701 801 1 2 SIG BODY J3 JC 142 0701 801 1 2 SIG BODY JP4 2 5V C15 0603 100pF C2 0603 0 1uF JP2 R1 0603 10k C6 0603 0 1uF C8 06...

Страница 6: ...1 2340 6111TN or 2380 6121TN 3M JP2 CONNECTOR HEADER 3X1 2340 6111TN or 2380 6121TN 3M J1 J2 J3 J4 J5 J6 J7 J8 CONNECTOR SMA SIDE MOUNT 901 10003 Amphenol J9 CONNECTOR POWER 2 POS 1729018 Phoenix Contact L1 RESISTOR SM 0 OHM 1206 CR1206 8W 000T Venkel R1 RESISTOR SM 10K 1 0603 CR0603 16W 1002FT Venkel R2 RESISTOR SM 2 55K 1 0603 CR0603 16W 2551FT Venkel U4 MAX6376XR23 T MAX6376XR23 T Maxim U5 Si53...

Страница 7: ...Si5310 EVB Rev 0 71 7 Figure 4 Si5310 Silkscreen ...

Страница 8: ...Si5310 EVB 8 Rev 0 71 Figure 5 Si5310 Component Side ...

Страница 9: ...Si5310 EVB Rev 0 71 9 Figure 6 Si5310 Solder Side ...

Страница 10: ...ent Change List Revision 0 7 to Revision 0 71 Added bill of materials Evaluation Board Assembly Revision History Assembly Level PCB Si5310 Device Assembly Notes B 01 B B Assemble per BOM rev B 01 C 01 C C Assemble per BOM rev C 01 ...

Страница 11: ...Si5310 EVB Rev 0 71 11 Notes ...

Страница 12: ...th which if it fails can be reasonably expected to result in significant personal injury or death Silicon Laboratories products are generally not intended for military applications Silicon Laboratories products shall under no circumstances be used in weapons of mass destruction including but not limited to nuclear biological or chemical weapons or missiles capable of delivering such weapons Tradem...

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