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SET-1240
Technical Description
Issue
02
13/04/2022
Description
The SET-1240 xVDT Emulator Card provides 8 independent xVDT emulator channels, with galvanic
isolated I/O. By this the applied excitation voltage and frequency can vary from channel to channel. Each
channel can be configured individually as 6-wire or 4/5-wire xVDT emulation.
The SET-1240 xVDT Emulator Card works with a wide excitation frequency range of 400 Hz to 10 kHz.
The emulated A and B signals can be controlled separately. This allows the SET-1240 xVDT Emulator
Card to emulate resolvers. In 5 and 6 wire configuration this also makes the simulation of over and
undervoltage faults of the A + B current sum signal possible.
The SET-1240 xVDT Emulator Card has several self-test features. One of them allows the use an
excitation signal injected by the instrumentation bus of the RTI, instead of the excitation signals from
the front I/O: The RTI excitation can be used for both, self-test, and normal operation.
The self-test excitation generation circuit of the SET-1240 xVDT Emulator Card can generate a 400 Hz, 1
kHz, and 10 kHz excitation signal. Either this signal or the RTI excitation can be selected as test excitation.
As test CNTL signal 0 V and ±10 V ±2% can be selected, which represents a gain of 0 and 1 ±2%.
Instead of passing the A and B signals to the Front I/O, they can be switched to the internal test bus
(, and Test_AB-). The internal test bus can be forwarded either to the Self-test
Evaluation circuit or to the instrumentation bus of the RTI. This includes the selection of either
or as signal.
The transformers used for the galvanic isolation are mounted on an internal sub-card and can be easily
replaced. Please contact the SET sales department if you require a customized transformer module.