Rohde & Schwarz ESRP Series, Руководство пользователя

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Spectrum Measurements
R&S
®
ESRP
276 User Manual 1175.7445.02 ─ 08
and the average trace separately so that the distribution of narrowband and wideband
sources of interference can be taken into account.
For example, the frequency of the maximum determined with the average detector can
be used for the final measurement performed with this detector and the frequency
found in the premeasurement carried out with the peak detector is taken for the final
measurement using the quasipeak detector.
Measuring at the Marker Position
Finding peaks with the help of a peak search reduces data to be evaluated and thus
measurement time.
The measurement at the marker frequency may have a different detector during the
peak search. This way, the measurement consumes much less time because detectors
with a long measurement time are needed only at the critical frequency.
The application also allows you to use multiple detectors for the final evaluation. The
advantage of multiple detection is that you will only need one test run to see if the
results comply with the limits specified in a standard. You can select and assign detec-
tors for EMI markers in the
"Marker Configuration" on page 279 dialog box.
As EMC tests often require special measurement times, you can also specify a dwell
time for the measurement with the EMI markers.
The application shows the results in the Marker Table .
Defining a Dwell Time for the Final Measurement
The dwell time defines for how long the R&S ESRP measures the signal at the fre-
quencies of the marker positions. Thus the dwell time defines the amount of data that
is included in the detection of the displayed results. As each detector needs a different
period of time to fully charge and discharge, the minimum dwell time should not be
shorter than the slowest detector in use.
Evaluating the Results
For more information on functionality to evaluate measurement results see Chap-
ter 5.2.4, "AF Demodulation" , on page 148 and Chapter 5.4.3, "(Limit) Lines" ,
on page 184.
Configuration and Analysis
Measurement Configuration
The reference section contains an overview of all functions that are part of the chapter
and lists the associated elements of the user interface.
For a list and description of supported detectors see Chapter 5.2.2, "Detectors" ,
on page 143.
Filter Type
Opens a submenu to select the filter type.
Measurements