Rev. 1.00, 05/04, page 528 of 544
Item Symbol
Min.
Typ.
Max.
Unit
Test
Conditions
Wait time after
SWE-bit setting
*
1
x 1 —
—
µs
Wait time after
ESU-bit setting
*
1
y 100
—
—
µs
Wait time after
E-bit setting
*
1
,
*
6
z 10
—
100
ms
Wait time after
E-bit clear
*
1
α
10
—
—
µs
Wait time after
ESU-bit clear
*
1
β
10
—
—
µs
Wait time after
EV-bit setting
*
1
γ
20
—
—
µs
Wait time after
dummy write
*
1
ε
2 —
—
µs
Wait time after
EV-bit clear
*
1
η
4 —
—
µs
Wait time after
SWE-bit clear
*
1
θ
100 — — µs
Erase
Maximum erase
count
*
1
,
*
6
,
*
7
N — — 120
times
Notes: 1.
Set the times according to the program/erase algorithms.
2. Programming time per 128 bytes (Shows the total period for which the P-bit in FLMCR1
is set. It does not include the programming verification time.)
3. Block erase time (Shows the total period for which the E-bit in FLMCR1 is set. It does
not include the erase verification time.)
4. Maximum programming time (t
P
(max))
t
P
(max)
= (wait time after P-bit setting (z1) + (z3))
×
6
+ wait time after P-bit setting (z2)
×
((N) – 6)
5. The maximum number of writes (N) should be set according to the actual set value of
z1, z2 and z3 to allow programming within the maximum programming time (t
P
(max)).
The wait time after P-bit setting (z1, z2, and z3) should be alternated according to the
number of writes (n) as follows:
1
≤
n
≤
6
z1 = 30µs, z3 = 10µs
7
≤
n
≤
1000
z2 = 200µs
6. Maximum erase time (t
E
(max))
t
E
(max) = Wait time after E-bit setting (z)
×
maximum erase count (N)
7. The maximum number of erases (N) should be set according to the actual set value of z
to allow erasing within the maximum erase time (t
E
(max)).
Содержание H8S/2111B
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