XE-100 AFM Order of Operations
1)
Turn on system, mount tip if needed
2)
Turn on XEC/XEP software
3)
Focus microscope on cantilever
4)
Position laser spot on end of cantilever
5)
Position laser reflection on center of photodetector (A+B ~3.5V, A-B and C-D ~0.3V)
6)
Select appropriate mode, scanner, and frequency
7)
Approach surface
i.
Get optically close (several mm)
ii.
Focus microscope ~50-100um from surface, move Z-stage til cantilever in focus
iii.
Click ‘Approach’
8)
Adjust scan parameters (Z servo gain, scan rate, set point, drive)
9)
Collect images
10)
Send to XEI to process/save
11)
Follow shutdown procedure