Park Systems XE-100 Скачать руководство пользователя

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XE-100 AFM Order of Operations

Turn on system, mount tip if needed

Turn on XEC/XEP software

Focus microscope on cantilever

Position laser spot on end of cantilever

Position laser reflection on center of photodetector (A+B ~3.5V, A-B and C-D ~0.3V)

Select appropriate mode, scanner, and frequency

Approach surface

Get optically close (several mm)

ii.

Focus microscope ~50-100um from surface, move Z-stage til cantilever in focus

iii.

Click ‘Approach’

Adjust scan parameters (Z servo gain, scan rate, set point, drive)

Collect images

10)

Send to XEI to process/save

11)

Follow shutdown procedure

Содержание XE-100

Страница 1: ...ser will move on the quadrant photodetector This is relayed to a motor controlling the tip which adjusts the tip s vertical position until the laser is aimed in the center of the quadrant photodetecto...

Страница 2: ...ting tip and place it in the good tips box Ensure new tip is rested in place and that bearings fit into tip slots 4 Replace head and push flaps away from you until slightly tight This secures the head...

Страница 3: ...n Look at where the light from the microscope is shining on the tip assembly as this will help you to center the microscope Position laser on cantilever If you don t see the laser reflected off the ca...

Страница 4: ...e appropriate value If after several tries you still can t get the sum high enough remove the head and check mirror 2 s position visually it should be roughly parallel to the base Adjust mirror 2 knob...

Страница 5: ...o 1 00 Cantilever General 4 Click OK 5 Turn Head back on in software Frequency Sweep Window will open 6 The software will automatically detect the cantilever s resonance peak and select a driving freq...

Страница 6: ...B and C D are still less than 0 3 V 9 Shut acoustic enclosure 10 Click Approach button in Z stage control When the approach stops the light in the Z stage Control window will stop blinking Ensure tha...

Страница 7: ...will change the distance the tip hovers above the sample surface when scanning and can improve resolution of features surface tracking This can be done manually by changing the number in the Set Poin...

Страница 8: ...h XEI You can send images directly to the XEI data analysis software from the Buffer in XEP by right clicking on them Or you can open them from the spmdata or User Files folders Flattening your sample...

Страница 9: ...er as needed 5 Turn off laser switch unplug head and remove head 5a If the tip you used was good leave it on the AFM Otherwise remove head and place tip in the Bad Probes box 6 Remove sample from stag...

Страница 10: ...ion on center of photodetector A B 3 5V A B and C D 0 3V 6 Select appropriate mode scanner and frequency 7 Approach surface i Get optically close several mm ii Focus microscope 50 100um from surface m...