F50
0
C-59
F500
Applications
Connector and IC Lead Inspections
BGA Inspections
Positioning Liquid Crystal Boards
Printing Defects
Molded Product Defect Inspections
Ceramic Board Defect Inspection
Inspecting Electrolytic Capacitor Dimensions
Chip Capacitor Electrode Defect Inspection
High-resolution inspection over
a wide field of view is enabled
by using a 1-million-pixel high-
resolution camera.
And with
macro
functions, the
statistics on lead pitch data and
linear approximations of the
lead ends are easily performed.
Length
Pitch
No. of leads
Combining
networking
enables changing inspection devices, manag-
ing master data, and uploading statistical data files with macros.
High-resolution inspection over
a wide field of view is also ena-
bled by using a 1-million-pixel
high-resolution camera with
BGA inspection software. Var-
iant BGA processing is also pos-
sible.
Quality control data can be used effectively by storing inspection im-
ages in relation to lot numbers. Managing all of the product data on
the host computer makes frequent changes to settings much
smoother.
Number of balls
Deformed ball
Offset ball
Incorrect
position
Ball size
EC processing, based on an
original algorithm from OM-
RON, enables position inspec-
tions of low-contrast alignment
marks. And using a Digital Inter-
face Camera enables stable
processing.
Macros
can also be used to
easily achieve original calibra-
tion methods, inspection data
calculations, and much more.
Managing productivity is also possible by saving and reviewing in-
spection images, detection data, and position compensation data.
Using a 1-million-pixel high-res-
olution camera provides high-
precision inspections over a
wide field of view.
Using
macros
enables saving
images and inspection data
classified by the type of fault.
For initial system startup, data to determine judgement values and
to troubleshoot problems can be accessed from a remote computer,
reducing costs to a minimum.
Misshapen products, as well as
contamination and scorching
around molded products, can
be detected. Setting is as easy
as specifying the circle size to
detect (i.e., the size of the de-
fects) on limit samples dis-
played on the monitor.
With
macros
, statistics on good products, NG products, and fault
rates for the inspections performed each day can be calculated and
logged in a Memory Card.
Image
Taken
Filtering
Again
Filtering
Again
EC Defect
Inspection
Inspect for cracks on the sur-
face of ceramic boards. Even if
uneven lighting or rough surfa-
ces show in the images, linear
aspects can be consistently de-
tected.
Using the
flow menus
enables
conversion to more stable in-
spection by repeatedly filtering
images.
The diameter of round workpie-
ces can be measured at multi-
ple points to determine if they
are round or not.
With
macros
, deviations in in-
spection values can be stored
in memory and statistics, such
as minimum values, maximum
values, and standard devia-
tions, can be calculated.
Even if the size of the inspec-
tion object changes, the size of
the inspection area adjusts to
the external size to enable
measurement. Misshapen prod-
ucts and contamination and
scorching around products can
be detected.
With
macros
, production statistics (e.g., number of good products,
number of NG products, and fault rates) can be calculated and moni-
tored onscreen.
F502-EN2-04.book Seite 59 Dienstag, 26. Juli 2005 5:48 17
