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NXP Semiconductors
UM11653
RDGD3160I3PH5EVB Reference Design
Name
Function
VCCHV
High-side phase V VCC voltage test point
Isolated positive voltage supply (15 V to 18 V)
VCCHW
High-side phase W VCC voltage test point
Isolated positive voltage supply (15 V to 18 V)
VCCLU
Low-side phase U VCC voltage test point
Isolated positive voltage supply (15 V to 18 V)
VCCLV
Low-side phase V VCC voltage test point
Isolated positive voltage supply (15 V to 18 V)
VCCLW
Low-side phase W VCC voltage test point
Isolated positive voltage supply (15 V to 18 V)
VSUP +12 V DC
VSUP low voltage positive supply connection (+12 V DC)
VSUP GND
VSUP low voltage supply ground connection (GND1)
4.2.7 Gate drive resistors
•
RGH - gate high resistor in series with the GH pin at the output of the GD3160 high-
side driver and IGBT gate that controls the turn on current for IGBT gate.
•
RGL - gate low resistor in series with the GL pin at the output of the GD3160 low-side
driver and IGBT gate that controls the turn off current for IGBT gate.
•
RAMC - series resistor between IGBT gate and AMC input pin of the GD3160 high-
side/low-side driver for gate sensing and Active Miller clamping.
Figure 7. Gate drive resistors for each phase high-side and low-side
UM11653
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User manual
Rev. 1 — 12 August 2021
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