NED
XCM16K80SAT8 UME-0023-02
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4.12 Test Pattern
This camera can generate a test pattern. Use the test pattern to verify the
proper timing and connections between the camera and the frame grabber
board.
The test pattern is as follows.
Figure 4-12-1 Test Pattern
Figure 4-12-2 Test Image
The test pattern is a ramp from 0 to 255DN, and then from 0 to 255DN in
8-bit mode, then starts at 0 again.