National Semiconductor LM98640CVAL, Руководство пользователя

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P.N:LM98640CVAL Desc:EVAL BOARD FOR LM98640
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7.6 AFE Timing Generator Window
The LM98640QML AFE Timing Generator settings can be programmed with the aid of the window shown below.
The AFE Timing Generator is used to align the CLAMP and SAMPLE pulses over the appropriate portions of the input
signal. First, the user should enable the Digital Test Monitor pins by selecting one of the radio buttons in the lower left
control. The user can than monitor the CLAMP and SAMPLE pulses along with the input signal on a scope and use the
Start/End numeric controls to align the pulses to their appropriate positions. The text under each waveform identifies
which clamp and sample pulses are related.
In Sample & Hold mode the CLAMP and SAMPLE pulses occur at the same time, and the CLAMP values are disabled.
Also note that in Sample & Hold mode only the Odd Clamp and Odd Sample pulses can be selected as a Digital Test
Monitor Output selection.
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