Microscan HawkEye 1500 Series, Руководство по верификации

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Verification Types
Da
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v2.4.1, Nov 2008 HawkEye™ 1500 Series Verification Manual 3-21
Parameters
• Axial Nonuniformity — The difference between the height and the width
with respect to the rows and columns.
• Cell Contrast — In AIM DPM-1-2006, the difference in the population of
dark pixels to the population of light pixels (see Figure 3–6) and uses the
sample principle as “Symbol Contrast” with modified definition.
• Cell Modulation — In AIM DPM-1-2006, a measurement of the uniformity
of the color of the dark areas and the light areas of the Data Matrix (see
Figure 3–6) similar to “Modulation” but differs in the implementation
details.
• Fixed Pattern Damage — A measurement of the errors in the borders of the
Data Matrix as well as any errors in the quiet zone around the code necessary
for the decoding process.
• Grid Nonuniformity — This measurement is a delta of the difference of the
measured grid in relation to the ideal grid formed from the four corners of
the Data Matrix.
• Minimum Reflectance — The lowest reflectance of any sample area in the
Data Matrix.
• Reference Decode — This is a pass/fail measurement of the Data Matrix
based upon a binary image of the code as specified in ISO/IEC 16022 (First
edition - 2000, Second edition - 2006).
• Unused Error Correction — The amount of error correction that could be
read incorrectly when the code is still readable that is currently being read
correctly expressed as a percentage.