Microscan HawkEye 1500 Series, Руководство по верификации

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Verification Types
Da
ta Matrix
Ve
ri
fi
c
a
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3
v2.4.1, Nov 2008 HawkEye™ 1500 Series Verification Manual 3-15
angle of distortion;grade score of angle of distortion;count of grade A;B;C;D;F;is
this value use to determine good/fair/poor;minimum level of good;minimum
level of fair;angle of distortion this cycle;angle of distortion average;cell fill x
this cycle;cell fill x average;cell fill y this cycle;cell fill y average;letter grade of
ovality;grade score of ovality;count of grade A;B;C;D;F;is this value use to
determine good/fair/poor;minimum level of good;minimum level of fair;ovality
this cycle;ovality average;contrast maximum;contrast minimum;pixels per
inch;contrast report;cell unit report;aperture;target calibration contrast;target
calibration reflectance;wavelength;light type;ECC level;calibrated state;code
height;code width;angle;calibrated mean light;calibrated exposure;calibrated
gain;calibrated black offset
Parameters
• Dot peening
– Angle of Distortion — The difference from perpendicular of the two
solid edges of the Data Matrix measured in degrees.
– Dot Center Offset — The linear difference of the location of the center
of the cell compared to the center of the ideal grid center calculated as a
percentage of the nominal cell size.
– Dot Size Offset — The difference is the apparent size of each individual
data element in the Data Matrix.
– Matrix Size — The overall size of the code as measured linearly across
the width or height.
– Module Fill — This measures the percentage of completeness of the
ideal grid.
– Nominal Module Size — The average value of the two values: X
Nominal Cell Size and Y Nominal Cell Size. X Nominal Cell Size is the
Data Matrix width in pixels divided by the number of columns; Y
Nominal Cell Size is the Data Matrix height in pixels divided by the
number of rows.
– Ovality — The difference of the widest part of the round cell versus the
narrowest part of the round cell.
• Laser and Electro-Chemical Etching