MeiG_SLM156_Hardware Design Manual
MeiG Smart Technology Co., Ltd
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LTE-FDD B8
supportive
<-100
<-102.8
LTE-FDD B12 supportive
<-100
<-102.8
LTE-FDD B13 supportive
<-100
<-102.8
LTE-FDD B14 supportive
<-100
<-102.8
LTE-FDD B18 supportive
<-100
<-102.8
LTE-FDD B19 supportive
<-100
<-102.8
LTE-FDD B20 supportive
<-100
<-102.8
LTE-FDD B25 supportive
<-100
<-102.8
LTE-FDD B26 supportive
<-100
<-102.8
LTE-FDD B27 supportive
<-100
<-102.8
LTE-FDD B28 supportive
<-100
<-102.8
LTE- B66
supportive
TBD
TBD
LTE- B71
supportive
TBD
TBD
LTE- B85
supportive
TBD
TBD
Network type band
main
diversity
GSM sensitivity/3GPP (dBm)
GSM
GSM850/GS
M900
supportive
Non-
supportive
<-102
DCS1800/PC
S1900
supportive
<-102
6.8 Environmental Reliability Requirements
Table 31 Environmental reliability requirements
Test items
Test condition
Low temperature storage test
temperature-45°C, last for 24h in shut down state
High temperature storage test
temp90°C, last for 24h in shut down state
Temperature shock test
In shut down mode, last for 1h under -45°C and +90°C,
temperature conversion time <3min, carry on 24 cycle
