Lexmark T52 Series, Руководство по обслуживанию

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Diagnostic Aids
3-13
4520-xxx
ROM Memory Test
The ROM Memory Test is used to check the validity of the controller
board code and fonts.
To run the ROM Memory Test:
1. Select ROM Memory Test from the menu. P and F represent the
same numbers for DRAM. The power indicator blinks indicating
the test is in process. The test runs continuously.
2. Press Return/Stop to exit the test.
Each time the test finishes, the screen updates with the result. If the
test passes, the Pass Count increases by 1, however if the test fails,
one of the following messages displays for approximately three
seconds: ROM Checksum Error or ROM Burst Read Error. Once the
maximum pass count or fail count is reached, the test stops with the
power indicator on solid. The results appear on the screen.
Parallel Wrap Test
This test is used with a wrap plug to check operation of the parallel
port hardware. Each parallel signal is tested.
To run the Parallel Wrap Test:
1. Disconnect the parallel interface cable and install the wrap plug
(P/N 1319128).
2. Select the Parallel Wrap Test from the menu. The power
indicator blinks indicating the test is in progress. The test runs
continuously until canceled.
Each time the test finishes, the screen updates. If the test passes,
the Pass Count increases by 1, however if the test fails, a message
displays for approximately three seconds. Once the maximum count
is reached the test stops. The power indicator goes on solid and the
final results display.
3. Press Return/Stop to exit the test.
Serial Wrap Test
This test is used to check the operation of the Serial Port Hardware
using a wrap plug. Each signal is tested.