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6
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OPERATING INSTRUCTIONS
*** CAUTION : UP TO 6400V ON TEST LEADS ***
INTRODUCTION
This Power Semiconductor Tester is designed to perform testing of power semiconductors, such as,
SCRs/Thyristors, Diodes, IGBTs, Transistors, and most MOS FETs.
The Cathode (Emitter) of the device under test is operated near ground potential.
The tester performs three tests : PFV (Peak Forward Voltage), PRV (Peak Reverse Voltage), and Gate
Voltage and Current to trigger (Base Current for Transistors). The test circuits are of the type recom-
mended by the JEDEC test standards RS397. The PRV/PFV tests applies a PEAK REVERSE VOLT-
AGE or PEAK FORWARD VOLTAGE, half wave 50
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60 Hertz wave form to the device and the result-
ing peak leakage current is measured by a peak storage circuit and displayed on a peak reading ammeter.
The E/I curve of the device can be displayed on an X/Y oscilloscope. The DC Gate test is used to meas-
ure the DC gate voltage and current required to trigger the device into its On
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state. The Anode
(Collector) supply is half wave 50/60 Hertz wave form.
The tester provides a Gate Voltage high enough to test for turn
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on of IGBTs and MOS FETs.
Both NPN and PNP bipolar transistors can be tested.
PREPARATIONS AND PRECAUTIONS
Plug the tester into a properly grounded three wire receptacle.
When testing pressure pack components (hockey pucks), the component
MUST
be compressed at ap-
prox. 200
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300 lbs. On page 5 is a suggested simple device for compressing these types of components.
It is recommended that the instrument is connected to ground via the GROUND terminal on the front
panel.
Note:
When testing IGBTs or Darlington Transistor modules, the base plate on the module un-
der test
MUST
be connected to the GROUND terminal.
NEVER
keep the test button pressed over 15 seconds!
NEVER
touch the test leads or the device under test while the
“
TEST
”
button is depressed.
Always
turn the Voltage Control to the zero position before connecting or disconnecting the device un-
der test.
It is possible to observe the E/I curve of the device under test by connecting an oscilloscope to the con-
nector on the front panel with the optional 2 connector cable. Connect the BNC connector with a red and
black wire to the X
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axis and the BNC connector with a green wire to the Y
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axis. Set the X
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axis to 0.2V/
div for a sensitivity of 200V/div and the Y
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axis to 0.1V/div for a sensitivity of 1mA/div. The output sen-
sitivity is automatically changed when the function switch is moved to the Gate position. Note that the
Anode wave form is displayed during the gate test, not the E/I curve.
