TK-272G
40
3. Sensitivity
[Panel Test Mode]
SSG
ANT
Check
1) CH-Sig:1-1
AF VTVM
Check
12dB SINAD or
SSG OUT
Oscilloscope
more
Wide:-117dBm (0.3
µ
V)
(MOD:1kHz /
±
3kHz)
Narrow:-115dBm (0.4
µ
V)
(MOD:1kHz /
±
1.5kHz)
4. Squelch (open) 1) Adj item [SQL3]
Encoder
Adjust to the
Adjust
Adjust [
∗∗∗
]
knob
squelch
[Wide]
SSG OUT:
squelch.
threshold point
Wide:-125dBm
Narrow:-124dBm (0.14
µ
V)
5. Squelch(Tight) 1) Adj item [SQL9]
Adjust to the
Adjust
Adjust [
∗∗∗
]
squelch
[Wide]
SSG OUT:
threshold point
Wide:-117dBm (0.3
µ
V)
[Narrow]
1) Adj item [SQL9.]
SSG OUT:
Narrow:-116dBm (0.35
µ
V)
6. Squelch
[Panel Test Mode]
Check
Squelch must
Check
1) CH-Sig:1-1
be opened.
SQ Level:[SQL5]
SSG OUT:
-118dBm (0.28
µ
V)
2) SSG OUT:OFF
Squelch must
be closed.
Item
Condition
Measurement
Adjustment
Specifications/
Test equipment
Terminal
Parts
Method
Remark
ADJUSTMENT
Adjustment points TX-RX unit (X57-587)
Component side view
Foil Side View
VR1 : Frequency adjustment
TC1 : Transmit lock voltage adjustment
TC2 : Receive lock voltage adjustment
L305:
L306:
Band-pass filter waveform adjustment
L307:
BPF : Band-pass filter test point
CV(LV) : Lock voltage adjustment terminal.
Fig. 2 Adjustment points
}
MIC
MIC
SP
IC14
C13
BPF
CN3
ANT
VR1
IC12
LV
CV
L307
L306
L305
TC1
TC2
Battery terminal
BPF
ANT
MIC
SP