Section 3: Test subroutine library reference
S530 Parametric Test System Test Subroutine Library User's Manual
3-60
S530-907-01 Rev. A / September 2015
Example
result = rvdp(pin1, pin2, pin3, pin4, sub, itest, &ratio)
Schematic
tdelay
This subroutine calculates the delay time, in seconds, for the number of pins, current, and voltage specified as
input parameters.
Usage
double tdelay(int
npin
, double
i
, double
v
)
npin
Input
The number of pins connected to the charging node
i
Input
The current, in amperes
v
Input
The voltage, in volts
Returns
Output
The calculated delay time
Details
This subroutine calculates the delay based on system capacitance, leakage currents, and the number
of pins connected to the source.
The
tdelay
subroutine differs from the
kdelay
subroutine because
kdelay
calculates and provides
a delay, but
tdelay
simply returns a value that can be passed into LPTLib calls such as
sweep
X
and
search
X
to provide an appropriate delay. See the discussion in the
(on page 3-47) subroutine
for more information.
Example
delay_time = tdelay(npin, i, v)
