S530 Parametric Test System Test Subroutine Library User's Manual
Section 2: Using the test subroutine library
S530-907-01 Rev. A / September 2015
2-3
Bipolar subroutines
Subroutine
Description
Link
beta1
Calculate DC
at specified I
E
and V
CB
(on page 3-1)
beta2
Calculate DC
and V
BE
at specified I
C
and
V
CE
(on page 3-3)
beta2a
Calculate
at V
CB
and I
CE
with search on I
E
(on page 3-4)
beta3a
Calculate
at V
CE
and I
CE
with search on I
BE
(on page 3-6)
bice
Calculate
when V
BE
swept, at V
CE
and V
SUB
(on page 3-8)
bvcbo
Measure collector-base breakdown voltage,
emitter open
(on page 3-10)
bvcbo1
Measure collector-base breakdown voltage
using LPTLib
bsweepv
subroutine
(on page 3-11)
bvceo
Measure collector-emitter breakdown voltage,
base open
(on page 3-13)
bvceo2
Measure collector-emitter breakdown voltage
using LPTLib
bsweepv
subroutine
(on page 3-14)
bvces
Measure collector-emitter breakdown voltage
(on page 3-15)
bvebo
Measure emitter-base breakdown voltage,
collector open
(on page 3-20)
ibic1
Measure I
CE
, I
BE
and calculate
at V
CE
, V
BE
,
V
SUB
(on page 3-35)
icbo
Measure collector-base leakage at V
CB
and
V
SUB
(on page 3-37)
iceo
Measure collector-emitter leakage at V
CE
and
V
SUB
(on page 3-38)
ices
Measure emitter-collector leakage at V
CES
and V
SUB
(on page 3-39)
iebo
Measure emitter-base leakage at V
EB
and
V
SUB
(on page 3-44)
rcsat
Estimate
rcsat
when I
C
and I
B
swept at
constant
(on page 3-50)
re
Estimate emitter resistance
(on page 3-53)
vbes
Measure base-emitter voltage at specified I
E
(V
C
= V
B
)
(on page 3-62)