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Connections
2-11
Table 2-1
Summary of measurement considerations
Considerations
Description
See Model 6487 Reference Manual, Appendix G for details.
Input bias current
Offset current of Model 6487 could affect low current measurements.
Voltage burden
Offset voltage of Model 6487 could cause errors if it is high in
relation to the voltage of the measured circuit.
Noise
Noise generated by source resistance and source capacitance.
See
for details.
Ground loops
Multiple ground points can create error signals.
Triboelectric effects
Charge currents generated in a cable by friction between a conductor
and the surrounding insulator (i.e., bending a triax cable).
Piezoelectric and stored
charge effects
Currents generated by mechanical stress on certain insulating
materials.
Electrochemical effects
Currents generated by the formation of chemical batteries on a
circuit board caused by ionic contamination.
Humidity
Reduces insulation resistance on PC boards and test connection
insulators.
Light
Light sensitive components must be tested in a light-free
environment.
Electrostatic interference
Charge induced by bringing a charged object near your test circuit.
Magnetic fields
The presence of magnetic fields can generate EMF (voltage).
Electromagnetic interference
(EMI)
EMI from external sources (i.e., radio and TV transmitters) can
affect sensitive measurements.
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