1 GENERAL
1.1 INTRODUCTION
The JSPM
−
5200 Scanning Probe Microscope is designed not only to meet researchers’
increasing demands for applied observation modes but also to make the most of the
intrinsic functions of a scanning probe microscope. This instrument is easy to use and is
superb in its expandability, enabling a number of people from novices to professional
SPM researchers to use it.
The following are the main features of this instrument.
•
It is possible to observe specimens under various conditions, from in a liquid to under
high vacuum, not to mention under atmospheric pressure, by attaching optional
accessories without making any modification of the basic unit.
•
Moreover, it is possible to observe a specimen that is being heated or cooled by
attaching a simple optional accessory.
•
You can handle quite a variety of modes such as AFM (Contact and AC modes), phase
image, FFM, STM, CITS and I-V using the standard instrument configuration. In
addition, you can use the observation modes for Kelvin-probe microscope images,
viscoelasticity images and pulsed force images by installing appropriate optional
accessories on the instrument.
•
The control software operates under Windows, and the control panel is of the tab type,
with only the minimum necessary controls, thus being easy to use even to SPM
novices.
•
A personal login function with which you can create your own environment, greatly
simplifies the operation of the instrument.
TMPM5200-2
1-1
