Appendix A
Test Results Definitions
Loopback status information
170
CT-650 Command-Line Reference Guide
Release 9.4
Loopback status information
When you type the Loopback command, the CT-650 displays the loop-
back status line (see
).The following fields appear
in the loopback status line.
E. Time
Elapsed time since the test started.
Slot
Slot location within a shelf. 1–15 for CT-650; 1–7 for
CT-650s.
Type
Type of test card installed in the slot.
A Side Sta-
tus/Reason
Status of test card:
Pass
or
Fail
.
----
indicates slot
is not occupied or the side is being tested.
B Side Sta-
tus/Reason
Status of test card:
Pass
or
Fail
.
----
indicates slot
is not occupied or the side is being tested.
Field
Description
Field
Description
Test
Test name associated with the loopback.
Loop Type
Type of loop.
Loop Direc-
tion
Loop direction,
UP
or
DOWN
. Applies to VF_Loop only;
blank for DTMF and User-defined.
Side
Side of the circuit is being looped,
SEL
(Selected) or
CON
(Connected).
Содержание CT-650
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Страница 22: ...Contents xxii CT 650 Command Line Reference Guide Release 9 4 ...
Страница 104: ...Chapter 7 DS0 VF Test Commands Description of VF test commands 78 CT 650 Command Line Reference Guide Release 9 4 ...
Страница 108: ...Chapter 8 Batch Files Unavailable commands for batch files 82 CT 650 Command Line Reference Guide Release 9 4 ...
Страница 198: ...Appendix A Test Results Definitions Loopback status information 172 CT 650 Command Line Reference Guide Release 9 4 ...
Страница 240: ...Appendix D Customer Services and Support Training options 214 CT 650 User s Guide Release 9 3 ...
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