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verify that the Application Note or Technical Brief is current before proceeding.

For information regarding Intersil Corporation and its products, see www.intersil.com

AN1330.0

June 13, 2007

Test Points

The board has various test points for ease of connecting 
probes to make measurements. The test points available are 
described in Table 1.

You can observe the D- and D+ USB signal of the full-speed 
channel on an oscilloscope or other test equipment by 
connecting a differential probe at JP3. 

You can observe the D- and D+ USB signal of the 
high-speed channel on an oscilloscope or other test 
equipment by connecting a differential probe at JP2.

You can observe the D- and D+ USB signal at the COM side 
of the switch on an oscilloscope or other test equipment by 
connecting a differential probe at JP1.

ISL54200EVAL1Z Board Schematic

TABLE 1.

 DESIGNATOR

DESCRIPTION

TP1

V

DD

 test point

TP2, TP4, TP5, 
TP6, TP7, TP8, 

TP9

Ground Test Point

TP3

VBUS Test Point From Computer

JP1

D-/D+ Differential Probe Connection - COM Side of 
Switch

JP2

D-/D+ Differential Probe Connection - High-Speed 
Device Side of Switch

JP3

D-/D+ Differential Probe Connection - Full-speed 
Device Side of Switch

TO

USB

EN

VBUSHS

IN

TO

HIGHSPEED

DEVICE

DEVICE

FULLSPEED

TO

HOST

USB

GND

VDD

VBUSFS

USB

1

TP1

0.1UF

R1

0

9

COM1

2

1

JP4

2

1

JP5

1

TP3

1

J6

1

J9

2

1

JP3

6

5

4

3

2

1

J3

R2

8

7

6

5

4

3

2

10

1

11

U1

1

J8

2

JP2

2

1

JP1

1

TP5

1

1

TP

7

1

TP

6

6

5

4

3

2

1

J1

C2

C1

TP

9

1

TP

8

1

TP2

1

1

J7

1

J5

1

J4

6

5

4

3

2

1

J2

COM2

VBUS

HSD+

FSD-

VFS

DFN10

0

10UF

FSD+

HSD-

1

VHS

TP4

897

-30

-00

4-9

0-

0

0

0

6

10

7

8

3

4

5

9

1

2

Generic

Pack.

EP

24

1

MOUNT

MOUNT

3

D

U

SB

_AR

A42

_T

1

1

A

USB

1

MOUNT

2

3

4

MOUNT

A

A

A

A

24

1

MOUNT

MOUNT

3

DU

S

B_A

R

A

4

2

_

T

11A

A

A

Application Note 1330

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