42
tinb07e1-e 2011-07 Vacuum Gauge Controller
6.3.29 TAD
Test A/D converter. Test the A/D converter. See
Chapter 5.4.10 A/D converter signal (Ad-S),
30 and
Chapter 5.4.11 A/D converter ID (Ad-i),
31.
S: TAD<CR>[<LF>]
R: <ACK><CR><LF>
S: <ENQ>
R: ±a.aaaa,±b.bbbb,±c.cccc,±d.dddd,±e.eeee,±f.ffff
<CR><LF>
6.3.30 TDI
Test display. Test the display. See Chapter 5.4.9 Display
test (di-t),
30.
S: TDI[,a]<CR>[<LF>]
R: <ACK><CR><LF>
S: <ENQ>
R: a<CR><LF>
6.3.31 TEE
Test EEPROM. Test the EEPROM. See Chapter 5.4.8
EEPROM test (EE-t),
30.
S: TEE<CR>[<LF>]
R: <ACK><CR><LF>
S: <ENQ>
R: aaaa<CR><LF>
The control character <ENQ> starts the test. It takes
approximately one second to complete the test.
6.3.32 TEP
Test EPROM. Test the EPROM. See Chapter 5.4.7
EPROM test (EP-t),
30.
S: TEP<CR>[<LF>]
R: <ACK><CR><LF>
S: <ENQ>
R: aaaa,bbbb<CR><LF>
The control character <ENQ> starts the test. It takes
approximately 5 seconds to complete the test.
f
Status of switching function 6
(see above)
Parameter
Significance
±a.aaaa
ADC channel 1 Reading of sensor 1
in volts.
0.0000…+11.0000
±b.bbbb
ADC channel 2. Reading of sensor 2
in volts.
0.0000…+11.0000
±c.cccc
ADC channel 3. Reading of sensor 3
in volts.
0.0000…+11.0000
±d.dddd
ADC channel 4. Identification of
sensor 1 in volts.
0.0000…+5.0000
±e.eeee
ADC channel 5. Identification of
sensor 2 in volts.
0.0000…+5.0000
±f.ffff
ADC channel 6. Identification of
sensor 3 in volts.
0.0000…+5.0000
Parameter
Significance
Parameter
Significance
a
Test status
0 = Off
1 = On
CAUTION
EEPROM life.
A large number of write operations will reduce
the EEPROM life.
Do not repeat the EEPROM test more often
than necessary (e.g. in program loops).
Parameter
Significance
aaaa
Error status. See Chapter 6.3.9
ERR,
36.
Parameter
Significance
aaaa
Error status. See Chapter 6.3.9
ERR,
36.
bbbb
Check sum (hexadecimal)
Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com