This Data Sheet may be revised by subsequent versions ©2004 Eon Silicon Solution, Inc., www.eonssi.com
or modifications due to changes in technical specifications.
28
EN25F16
Rev. F, Issue Date: 2009/03/16
Table 12. DATA RETENTION and ENDURANCE
Parameter Description
Test Conditions
Min
Unit
150°C 10
Years
Data Retention Time
125°C 20
Years
Erase/Program Endurance
-40 to 85 °C
100k
cycles
Table 13. CAPACITANCE
( V
CC
= 2.7-3.6V)
Parameter Symbol
Parameter Description
Test Setup
Typ
Max
Unit
C
IN
Input Capacitance
V
IN
= 0
6 pF
C
OUT
Output Capacitance
V
OUT
= 0
8 pF
Note :
Sampled only, not 100% tested, at TA =
25°C and a frequency of 20MHz.
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