Huawei U8650, Руководство по обслуживанию

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U8950 Maintenance Guide V1.0 9 Maintenance Records During Verification
2012-10-22 Huawei Proprietary and Confidential 35
Stage Station of Fault Faulty Item Symptom Solution
V3 BT BT use
3in1-chip-erro
rr The CT test was
missed. The test passed when testing the CT
before the BT.
V3 Loading B01 uploading
failure The CPU was
short-circuited. The main board current is about 338
mA, and the CPU got heated.
Replace the CPU.
V3 Loading B01 uploading
failure The flash chip was
poorly soldered. The software was reloaded and no
interface was detected. The flash
chip was re-soldered and the test
then passed.
V3 CT 26201N The unit U3401 was
translocated. The unit U3401 was re-soldered.
V3 CT 26201N The unit U3401 was
poorly soldered and
did not perform
amplification when
tested using
W-CDMA. The unit U3401 was re-soldered.
V3 CT 26201N The unit U3402 was
poorly soldered and
proved to attenuate
signals by 10 dBm
when tested using
W-CDMA. The unit U3402 was re-soldered.
V3 CT 262010 During a manual
test, RF signal
output was detected
and closed after a
while. The faulty product was retained for
further analysis by the R&D
department.
V4 Loading
The loading
failed at 82%. The loading program
was faulty. The program was eliminated and
reloaded and the test then passed.
V4 MMI NFC function
failure NFC function is
faulty. The phone was restarted and the
NFC function was enabled and the
test then passed.
V4 MMI MMI08B
compass
malfunction The chip U1205 was
damaged due to
external impact,
resulting in the
failure of compass
function test. After confirmation by the R&D
department, the problem of broken
solder beads was cleared by heating
and re-soldering the chip. It was
determined that the chip was
damaged. To solve the problem,
replace the chip.
V4 MMI MMI07A FM
malfunction A mis-test occurred. The test passed when it was
performed twice more.