
Eye
,
Mask
and
Eyeline
Mode
Measurement
T
utorials
T
esting
to
a
Mask
V
erifying
waveform
conformance
to
the
mask
With
mask
testing
activated,
the
instrument
automatically
determines
the
waveform
conformance
to
the
mask.
The
following
information
is
displayed
on
the
bottom
of
the
display
.
STM16/OC48
This
is
the
standard
mask
to
which
the
eye
is
being
tested.
total
wfms
This
is
the
number
of
waveforms
taken
(total
samples/record
length).
failed
wfms
This
is
the
number
of
waveforms
that
have
violated
the
mask.
total
samples
The
number
of
data
points
compared
to
the
mask.
failed
samples
The
number
of
data
points
which
violate
the
mask.
1
This
represents
the
number
of
failed
samples
that
have
violated
the
center
(number
1)
region
of
the
mask.
2
This
represents
the
number
of
failed
samples
that
have
violated
the
upper
(number
2)
region
of
the
mask.
3
This
represents
the
number
of
failed
samples
that
have
violated
the
lower
(number
3)
region
of
the
mask.
Using
mask
margins
When
a
test
device
passes
a
mask
test
without
any
violations
,
it
is
often
useful
to
determine
the
margin
of
compliance
.
Mask
margins
are
used
for
this
purpose
.
First
a
mask
measurement
is
made
,
then
the
mask
is
linearly
increased
in
size
by
a
particular
percentage
.
F
or
instance
,
if
you
want
to
verify
that
the
test
device
can
comply
to
a
standard
mask
with
a
20%
margin,
the
margin
value
is
set
to
20%.
If
a
test
device
fails
to
comply
to
a
standard
mask
you
may
set
a
negative
margin,
and
determine
where
the
device
starts
to
fail.
T
esting
to
a
xed
margin
T
o
establish
a
mask
margin,
use
the
following
procedure:
1.
Make
a
mask
measurement
as
outlined
in
the
previous
procedure
.
2.
Select
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
Create
mask...
on
the
Mask
T
est
softkey
menu.
3.
Select
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
Mask
margins
on
from
the
Create
Mask
menu.
4.
Set
the
margin
percentage
by
selecting
the
NNNNNNNNNNNNNNNNNNNNNNNNNN
Margin
%
softkey
and
using
the
knob
.
5-34
Содержание 54750A
Страница 1: ...User s Guide HP 83480A Analyzer HP 54750A Oscilloscope ...
Страница 6: ...NOTE Clean the cabinet using a damp cloth only vi ...
Страница 7: ...X Ray Radiation Notice vii ...
Страница 8: ...Declaration of Conformity viii ...
Страница 17: ...Figure0 1 Exampleof astatic safeworkstation xvii ...
Страница 28: ......
Страница 43: ...1 The Instrument at a Glance ...
Страница 57: ...The Rear Panel Figure1 3 Theinstrument rearpanel 1 15 ...
Страница 60: ...TheInstrument ataGlance ...
Страница 61: ...2 General Purpose Keys ...
Страница 69: ...3 Speci cations and Characteristics ...
Страница 76: ...Speci cationsand Characteristics ...
Страница 77: ...4 Calibration Overview ...
Страница 84: ...CalibrationOverview ...
Страница 85: ...5 Eye Mask and Eyeline Mode Measurement Tutorials ...
Страница 136: ...Eye Mask andEyelineModeMeasurement Tutorials ...
Страница 137: ...6 The Digital Communications Analysis Menus ...
Страница 173: ...The Digital Communications Analysis Menus MeasureEyeMenu Figure6 7 Crossing measurement 6 37 ...
Страница 178: ...The Digital Communications Analysis Menus MeasureEye Menu Figure6 11 MeasuringQ factor 6 42 ...
Страница 191: ...7 Waveform Measurements ...
Страница 211: ...8 Making Automatic Measurements ...
Страница 233: ...9 Increasing Measurement Accuracy and Time Interval Measurement ...
Страница 252: ...IncreasingMeasurement Accuracy andTime Interval Measurement ...
Страница 253: ...10 General Purpose Oscilloscope Menus ...
Страница 317: ...11 The General Function Menus ...
Страница 345: ...The General Function Menus DisplayMenu Figure11 3 Connecteddots 11 29 ...
Страница 415: ...12 Messages ...
Страница 421: ...13 How the Instrument Works ...
Страница 453: ...Index ...