Haier HL26ATB, Руководство по обслуживанию, Страница: 28 / 52

5
5
4
4
3
3
2
2
1
1
D D
C C
B B
A A
The MEMTEST pin is used to control the variable drive
capability of the memory section I/Os. It is connected
to memory VSS through a 45 ohm +/- 1% resistor. The
N transistors of the output buffer in the MEMTEST I/O
will drive a current through this resistor and the
resultant voltage is used to measure the drive
capability.
decoupling
caps below
ESR=0.5R ESR=0.5R
DNI
DNI
<Doc> 1.0
<Title>
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3 25 Thursday, November 02, 2006
Title
Size Document Number Rev
Date: Sheet of
MEM_AD0 MAD0
MEM_AD1 MAD1
MEM_AD2 MAD2
MEM_AD3 MAD3
MEM_AD6 MAD6
MEM_CKEn#
MEM_CLK
MEM_CLK#
MEM_CS1#
MEM_CS0#
MEM_RWE#
MEM_RAS#
MEM_DQ0
MEM_DQ1
MEM_DQ2
MEM_DQ3
MEM_DQ4
MEM_DQ5
MEM_DQ6
MEM_DQ7
MEM_DQ8
MEM_DQ9
MEM_DQ10
MEM_DQ11
MEM_DQ12
MEM_DQ13
MEM_DQ14
MEM_DQ15
MEM_DQ16
MEM_DQ17
MEM_DQ18
MEM_DQ19
MEM_DQ20
MEM_DQ21
MEM_DQ22
MEM_DQ23
MEM_DQ24
MEM_DQ25
MEM_DQ26
MEM_DQ27
MEM_DQ28
MEM_DQ29
MEM_DQ30
MEM_DQ31
MEMVMODE0
MEMVMODE1
MVREFS
MVREFD
MEMTEST
MVREFS MEMVMODE1 MEMVMODE0 MVREFD
MEM_CAS#
MEM_AD11 MAD11
MEM_AD4 MAD4
MEM_AD5 MAD5
MEM_AD7 MAD7
MEM_AD8 MAD8
MEM_AD9 MAD9
MEM_AD10 MAD10
MEM_AD12 MAD12
MEM_AD14 MAD14
MEM_AD13 MAD13
MCAS# 4
MRWE# 4
MCS0# 4
MRAS# 4
MCKEn# 4
MCLK# 4
MCLK 4
MAD[14:0] 4
MEM_DQ[31:0] 4
MEM_DQM0# 4
MEM_DQM1# 4
MEM_DQM2# 4
MEM_DQM3# 4
MEM_QS0 4
MEM_QS1 4
MEM_QS2 4
MEM_QS3 4
VDDR_MEM
VDDR_MEM
+3.3V
VDDR_MEM
VDDR_MEM OSC1.8V
C4
100nF
R5
1K
R12
1K
C6
100nF C7
100nF
C14
100uF_16V
R4
45.3R
R7
1K
TP1
E1A
X240
R29
V30
AH26
AJ26
AC28
AC29
AD29
AE30
AD28
AC27
AD30
AB28
AB27
AE27
AD27
AE28
AC30
AA27
AB29
AA29
AA30
Y27
AA28
Y28
AB30
Y29
W29
AH29
AG29
AF28
AG28
AF27
R26
T26
W30
Y26
AA26
AB26
AF24
AG30
U26
AC26
AF30
P28
P27
R27
R28
R30
T27
T28
T29
V28
V27
W27
V29
U30
U29
U28
U27
AH30
AG27
AH28
AJ29
AH27
AG26
AK27
AJ28
AH24
AK25
AG23
AJ25
AG24
AH25
AJ24
AG25
T30
W28
AJ27
AK26 P26
AF25
AF26
AK28
AF23
QSA0
QSA1
QSA2
QSA3
MAA0
MAA1
MAA2
MAA3
MAA4
MAA5
MAA6
MAA7
MAA8
MAA9
MAA10
MAA11
MAA12
MAA13
MAA14
RASA#
CASA#
WEA#
CSA#0
CSA#1
CKEA
CLKA
CLKA#
MVREFD
MVREFS
MEMTEST
MEMVMODE0
MEMVMODE1
VDDR1_1
VDDR1_2
VDDR1_3
VDDR1_4
VDDR1_5
VDDR1_6
VDDR1_7
VDDR1
PESD_1
PESD_2
VSS
DQA0
DQA1
DQA2
DQA3
DQA4
DQA5
DQA6
DQA7
DQA8
DQA9
DQA10
DQA11
DQA12
DQA13
DQA14
DQA15
DQA16
DQA17
DQA18
DQA19
DQA20
DQA21
DQA22
DQA23
DQA24
DQA25
DQA26
DQA27
DQA28
DQA29
DQA30
DQA31
DQMA#0
DQMA#1
DQMA#2
DQMA#3
VDDR1_0
VDDR1_8
VDDR1_9
VDDR1_10
PESD_3
C10
100nF C9
100nF
C1
100nF
R9
1K
R6
1K
R3 22R
C13
100uF_16V
R10
1K
C5
100nF
R2 22R
R1 22R
C3
100nF C12
100nF
R8
1K_DNI
R11
1K_DNI
C11
100nF C8
100nF C2
100nF