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BX-245 • 17
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Multi-frequency measurements of the
impedance and the reflection coefficient
are in principle similar as when measuring
SWR. The same applies to the operation
of the Analyzer (Fig. 28 … 30). In addition
to the single pass, which is only triggered
again when a measuring parameter is
changed on the device, it is also possible
to select the cyclic measuring run (Con-
tinuous Sweep run). This is automatically
restarted by the Analyzer again and again.
Changes in the measured values are there-
fore relatively quickly visible. The disad-
vantage, however, is a higher power con-
sumption of the device.
Fig. 29: Example of the multi-frequency mea-
surement the impedance; the real and imag-
inary parts are displayed next to the marker
frequency.
Fig. 30: Example of the multi-frequency mea-
surement the reflection coefficient, the re-
sult is a small Smith chart; the real and Imag-
inary part and other calculated values
are displayed below the marker frequency.