e200z335 Core Complex Overview
e200z3 Power Architecture Core Reference Manual, Rev. 2
1-4
Freescale Semiconductor
1.1.1
Features
Key features of the e200z3 and e200z335 are summarized as follows:
•
Single-issue, 32-bit Power ISA–compliant core
•
Implementation of the VLE category for reduced code footprint
•
In-order execution and retirement
•
Precise interrupt handling
•
Branch processing unit (BPU)
— Dedicated branch address calculation adder
— Branch acceleration using a branch target buffer (BTB)
•
Load/store unit (LSU)
— 1-cycle load latency
— Fully pipelined
— Big- and little-endian support on a per-page basis
— Misaligned access support
— Zero load-to-use pipeline bubbles
•
AMBA™ (advanced microcontroller bus architecture) AHB (advanced high-performance
bus)-Lite 64-bit system bus
•
MMU with 16-entry (8-entry in the e200z335), fully associative TLB and multiple page-size
support
•
Signal processing engine (SPE) category supporting integer operations using both halves of the
64-bit GPRs
•
Single-precision embedded scalar floating-point category
•
Single-precision embedded vector floating-point category that uses both halves of the 64-bit GPRs
•
Nexus Class 3 (class 2+ in the e200z335) real-time development unit
•
Power management
— Low-power design—extensive clock gating
— Power-saving modes: doze, nap, sleep
— Dynamic power management of execution units
•
e200z3 and e200z335-specific debug interrupt. The e200z3 family implements the debug interrupt
as defined by the Power ISA with the following changes:
— When the debug instructions are enabled (HID0[DAPUEN] = 1), debug is no longer a critical
interrupt, but uses DSRR0 and DSRR1 for saving machine state on context switch.
— The Return from Debug Interrupt (rfdi) instruction supports the debug save/restore registers
(DSRR0 and DSRR1).
— A critical interrupt taken debug event allows critical interrupts to generate a debug event.
— A critical interrupt return debug event allows debug events to be generated for rfci instructions.
•
Testability
— Synthesizable, full MuxD scan design
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