Hangzhou Zhongchuang Electronics Co., Ltd.
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5.8 Comparator function
See 5.2.8 Selection of tolerance and 5.2.9 Selection of nominal value.
5.9 Correction function
The correction function applies to the open and short circuit. By correcting it can
effectively reduce the error of distributed parameters caused by the test line. The short
circuit correction can reduce the impact of the contact resistance and lead resistance on
the measurement of low impedance element; and the open circuit correction can reduce
the impact of the distributed capacitance and resistance between the two ends of the test
line on the measurement of high impedance element.
The method of correction is shown as follows:
1. Before entering the correction function, please ensure that the test terminals are
open- or short-circuited. Press ▲NULL to enter the correction interface, then the
instrument automatically identify whether it is open or short circuit as shown in Figure
11;
MEAS DISP
Bias:
0mV
Level:
600mV
Freq:
Range:AUTO
USB
SLOW
1kHz
CORR
Figure 11
2. Short press ▲NULL for open (OPEN) or short (SHORT) circuit correction and the
interface is shown as in Figure 12. If the correction is successful, the secondary
display shows "SUCESS"; or it shows "FAILED".
Note: Do not change the state of the test terminals during the correction.
3. After the correction ends, short press ▲NULL to return to the measurement
display.
Figure 12
6. Rapid application guide
Warning:
