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® 16k CXP
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UM 16k CXP – Indice E - 06/13
e2v semiconductors SAS 2013
6.2.2.4
Test Image Pattern Selector
This selection
Defines if the data comes from the normal Sensor operation and FPGA Chain or from
digital patterns generated at the end of the FPGA. This is mainly useful to detect some interfacing or
connection issues.
To switch to Cmos sensor image
Grey Horizontal Ramp (Fixed) :
See AppendixA
White Pattern (Uniform white image : 255 in 8Bits or 4095 in 12bits)
Grey Pattern (Uniform middle Grey : 128 in 8bits or 2048 in 12 bits)
Black Pattern (Uniform black : 0 in both 8 and 12 bits)
Grey vertical Ramp (moving)
When any of the Test pattern is enabled, the whole processing chain of the FPGA is disabled.