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3-10
Diagnostics
Example 3-4 Testing an SI Device (Continued)
***
*** ILEXER (InLine Exerciser) V 001 *** 17-NOV-1992 03:10:28 ***
***
Enable Bad Block Replacement (Y/N) [N] ?
4
Available Disk Drives: D0001 D0002 D0003 D0213
Available Tape Drives: NONE
Select next drive to test (Tnnnn/Dnnnn) [] ? d0003
5
Write enable drive (Y/N) [N] ?
*** Available tests are:
1. Random I/O
2. Seek Intensive I/O
3. Data Intensive I/O
4. Oscillatory Seek
Select test number (1:4) [1] ?
Select start block number (0:547040) [0] ?
Select end block number (0:547040) [547040] ?
Select data pattern number 0=ALL (0:15) [0] ?
Select another drive (Y/N) [] ? n
Select execution time limit, 0=Infinite, minutes (0:65535) [0] ? 1
Select report interval, minutes (0:65535) [1] ?
Select hard error limit (0:32) [0] ?
Report soft errors (Y/N) [N] ?
Execution Performance Summary at 17-NOV-1992 03:12:36
6
D0003 193531233 1998 4508 0 0 0 0
7
8
9
14
Execution Performance Summary at 17-NOV-1858 00:02:37
D0003 * 193531233 2003 4513 0 0 0 0
***
*** ILEXER is exiting.
***
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Содержание VAX 10000
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Страница 112: ...B 12 Power System Troubleshooting Figure B 8 IOP Module BXB 0356A 92 Self Test LED Oscillator Switch...
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