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Appendix
Datacolor 245™ User's Guide
Instrument Specifications
Specifications are subject to change without notice.
ITEM
DESCRIPTION
Instrument Type
Dual beam reflectance spectrophotometer.
Measuring Geometry
45º illumination, 0º viewing in conformance with
ASTM E1164-02, and Level B instrument following
the CIE Technical Committee 2-39 proposal.
Illumination Source
Pulsed xenon
Spectral Analyzer
Proprietary SP 2000 analyzer with dual 256-diode
array and high-resolution holographic grating.
Wavelength Range
400 – 700nm
Reporting Interval
10 nm
Effective Bandwidth
10nm
Photometric Range
0 to 200%
Aperture Configuration
16mm illuminated
11 mm viewed
Power
100 to 240 VAC
47 to 63 Hz
80 VA Peak
35 VA Typical
Performance—Repeatability*
20 reads, using dual flash
0.03 (max)CIELAB on white ceramic
Performance—Inter-Instrument
Agreement*
0.2 CIELAB
∆
E (max)
0.1 CIELAB average
Absolute Operating Environment
5º to 40º C, 5-85% RH, non-condensing
Interface
RS232 9600/19200 baud ~or~ USB 1.1 or higher
Warranty
1-year parts and labor. Extended warranty available.
Dimensions
(without drawer)
English
Metric
Height
6.5 inches
165.1 mm
Width
6.75 inches
171.5 mm
Depth
12.375 inches
314 mm
Weight
14 lbs.
6.3 kg
* Specification based on following environmental conditions: 20°C; 50% RH; 2 sigma
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