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CY7C1541V18, CY7C1556V18
CY7C1543V18, CY7C1545V18

Document Number: 001-05389 Rev. *F

Page 13 of 28

between the TDI and TDO pins and shifts the IDCODE out of the
device when the TAP controller enters the Shift-DR state. The
IDCODE instruction is loaded into the instruction register at
power up or whenever the TAP controller is supplied a
Test-Logic-Reset state.

SAMPLE Z

The SAMPLE Z instruction connects the boundary scan register
between the TDI and TDO pins when the TAP controller is in a
Shift-DR state. The SAMPLE Z command puts the output bus
into a High-Z state until the next command is supplied during the
Update-IR state.

SAMPLE/PRELOAD

SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When
the SAMPLE/PRELOAD instructions are loaded into the
instruction register and the TAP controller is in the Capture-DR
state, a snapshot of data on the input and output pins is captured
in the boundary scan register. 

The user must be aware that the TAP controller clock can only
operate at a frequency up to 20 MHz, while the SRAM clock
operates more than an order of magnitude faster. Because there
is a large difference in the clock frequencies, it is possible that
during the Capture-DR state, an input or output undergoes a
transition. The TAP may then try to capture a signal while in
transition (metastable state). This does not harm the device, but
there is no guarantee as to the value that is captured.
Repeatable results may not be possible.

To guarantee that the boundary scan register captures the
correct value of a signal, the SRAM signal must be stabilized
long enough to meet the TAP controller's capture setup plus hold
times (t

CS

 and t

CH

). The SRAM clock input might not be captured

correctly if there is no way in a design to stop (or slow) the clock
during a SAMPLE/PRELOAD instruction. If this is an issue, it is
still possible to capture all other signals and simply ignore the
value of the CK and CK captured in the boundary scan register.

After the data is captured, it is possible to shift out the data by
putting the TAP into the Shift-DR state. This places the boundary
scan register between the TDI and TDO pins.

PRELOAD places an initial data pattern at the latched parallel
outputs of the boundary scan register cells before the selection
of another boundary scan test operation.

The shifting of data for the SAMPLE and PRELOAD phases can
occur concurrently when required, that is, the data captured is
shifted out, the preloaded data can be shifted in.

BYPASS

When the BYPASS instruction is loaded in the instruction register
and the TAP is placed in a Shift-DR state, the bypass register is
placed between the TDI and TDO pins. The advantage of the
BYPASS instruction is that it shortens the boundary scan path
when multiple devices are connected together on a board.

EXTEST

The EXTEST instruction drives the preloaded data out through
the system output pins. This instruction also connects the
boundary scan register for serial access between the TDI and
TDO in the Shift-DR controller state.

EXTEST OUTPUT BUS TRI-STATE

IEEE Standard 1149.1 mandates that the TAP controller be able
to put the output bus into a tri-state mode. 

The boundary scan register has a special bit located at bit #108.
When this scan cell, called the “extest output bus tri-state”, is
latched into the preload register during the Update-DR state in
the TAP controller, it directly controls the state of the output
(Q-bus) pins, when the EXTEST is entered as the current
instruction. When HIGH, it enables the output buffers to drive the
output bus. When LOW, this bit places the output bus into a
High-Z condition. 

This bit can be set by entering the SAMPLE/PRELOAD or
EXTEST command, and then shifting the desired bit into that cell,
during the Shift-DR state. During Update-DR, the value loaded
into that shift-register cell latches into the preload register. When
the EXTEST instruction is entered, this bit directly controls the
output Q-bus pins. Note that this bit is preset HIGH to enable the
output when the device is powered up, and also when the TAP
controller is in the Test-Logic-Reset state. 

Reserved

These instructions are not implemented but are reserved for
future use. Do not use these instructions.

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Содержание CY7C1541V18

Страница 1: ...f two separate ports the read port and the write port to access the memory array The read port has dedicated data outputs to support read operations and the write port has dedicated data inputs to sup...

Страница 2: ...g Reg 16 21 32 8 NWS 1 0 VREF Write Add Decode Write Reg 16 A 20 0 21 2M x 8 Array 2M x 8 Array 2M x 8 Array 8 CQ CQ DOFF Q 7 0 8 QVLD 8 8 8 Write Reg Write Reg Write Reg 2M x 9 Array CLK A 20 0 Gen K...

Страница 3: ...8 BWS 1 0 VREF Write Add Decode Write Reg 36 A 19 0 20 1M x 18 Array 1M x 18 Array 1M x 18 Array 18 CQ CQ DOFF Q 17 0 18 QVLD 18 18 18 Write Reg Write Reg Write Reg 512K x 36 Array CLK A 18 0 Gen K K...

Страница 4: ...S VSS VSS VDDQ NC NC Q0 M NC NC NC VSS VSS VSS VSS VSS NC NC D0 N NC D7 NC VSS A A A VSS NC NC NC P NC NC Q7 A A QVLD A A NC NC NC R TDO TCK A A A NC A A A TMS TDI CY7C1556V18 8M x 9 1 2 3 4 5 6 7 8 9...

Страница 5: ...C D0 Q0 R TDO TCK A A A NC A A A TMS TDI CY7C1545V18 4M x 36 1 2 3 4 5 6 7 8 9 10 11 A CQ NC 288M A WPS BWS2 K BWS1 RPS A NC 144M CQ B Q27 Q18 D18 A BWS3 K BWS0 A D17 Q17 Q8 C D27 Q28 D19 VSS A NC A V...

Страница 6: ...is organized as 8M x 8 4 arrays each of 2M x 8 for CY7C1541V18 8M x 9 4 arrays each of 2M x 9 for CY7C1556V18 4M x 18 4 arrays each of 1M x 18 for CY7C1543V18 and 2M x 36 4 arrays each of 512K x 36 f...

Страница 7: ...be connected to a pull up through a 10 K or less pull up resistor The device behaves in QDR I mode when the DLL is turned off In this mode the device can be operated at a frequency of up to 167 MHz wi...

Страница 8: ...he next rising edge of the positive input clock K This enables for a seamless transition between devices without the insertion of wait states in a depth expanded memory Write Operations Write operatio...

Страница 9: ...e input clock of the QDR II The timing for the echo clocks is shown in Switching Characteristics on page 23 Valid Data Indicator QVLD QVLD is provided on the QDR II to simplify data capture on high sp...

Страница 10: ...portion of a write sequence CY7C1541V18 only the upper nibble D 7 4 is written into the device D 3 0 remains unaltered CY7C1543V18 only the upper byte D 17 9 is written into the device D 8 0 remains...

Страница 11: ...e device D 35 9 remains unaltered L H H H L H During the Data portion of a write sequence only the lower byte D 8 0 is written into the device D 35 9 remains unaltered H L H H L H During the Data port...

Страница 12: ...be serially loaded into the instruction register This register is loaded when it is placed between the TDI and TDO pins as shown in TAP Controller Block Diagram on page 15 Upon power up the instructio...

Страница 13: ...t the data by putting the TAP into the Shift DR state This places the boundary scan register between the TDI and TDO pins PRELOAD places an initial data pattern at the latched parallel outputs of the...

Страница 14: ...State Diagram TEST LOGIC RESET TEST LOGIC IDLE SELECT DR SCAN CAPTURE DR SHIFT DR EXIT1 DR PAUSE DR EXIT2 DR UPDATE DR 1 0 1 1 0 1 0 1 0 0 0 1 1 1 0 1 0 1 0 0 0 1 0 1 1 0 1 0 0 1 1 0 SELECT IR SCAN CA...

Страница 15: ...Voltage 0 65VDD VDD 0 3 V VIL Input LOW Voltage 0 3 0 35VDD V IX Input and Output Load Current GND VI VDD 5 5 A 0 0 1 2 29 30 31 Boundary Scan Register Identification Register 0 1 2 108 0 1 2 Instruct...

Страница 16: ...TDI Hold after Clock Rise 5 ns tCH Capture Hold after Clock Rise 5 ns Output Times tTDOV TCK Clock LOW to TDO Valid 10 ns tTDOX TCK Clock LOW to TDO Invalid 0 ns TAP Timing and Test Conditions Figure...

Страница 17: ...on Codes Instruction Code Description EXTEST 000 Captures the input and output ring contents IDCODE 001 Loads the ID register with the vendor ID code and places the register between TDI and TDO This o...

Страница 18: ...35 10E 63 2A 91 3L 8 9R 36 10D 64 1A 92 1M 9 11P 37 9E 65 2B 93 1L 10 10P 38 10C 66 3B 94 3N 11 10N 39 11D 67 1C 95 3M 12 9P 40 9C 68 1B 96 1N 13 10M 41 9D 69 3D 97 2M 14 11N 42 11B 70 3C 98 3P 15 9M...

Страница 19: ...ovide stable power and clock K K for 2048 cycles to lock the DLL DLL Constraints DLL uses K clock as its synchronizing input The input must have low phase jitter which is specified as tKC Var The DLL...

Страница 20: ...GH Voltage Note 19 VDDQ 2 0 12 VDDQ 2 0 12 V VOL Output LOW Voltage Note 20 VDDQ 2 0 12 VDDQ 2 0 12 V VOH LOW Output HIGH Voltage IOH 0 1 mA Nominal Impedance VDDQ 0 2 VDDQ V VOL LOW Output LOW Voltag...

Страница 21: ...e 14 Parameter Description Test Conditions Min Typ Max Unit VIH Input HIGH Voltage VREF 0 2 VDDQ 0 24 V VIL Input LOW Voltage 0 24 VREF 0 2 V Capacitance Tested initially and after any design or proce...

Страница 22: ...1 11 82 C W JC Thermal Resistance Junction to Case 2 33 C W Figure 4 AC Test Loads and Waveforms 1 25V 0 25V R 50 5 pF INCLUDING JIG AND SCOPE ALL INPUT PULSES Device RL 50 Z0 50 VREF 0 75V VREF 0 75V...

Страница 23: ...ns tCQDOH tCQHQX Echo Clock High to Data Invalid 0 2 0 2 0 2 ns tCQH tCQHCQL Output Clock CQ CQ HIGH 26 0 88 1 03 1 15 ns tCQHCQH tCQHCQH CQ Clock Rise to CQ Clock Rise 26 rising edge to rising edge 0...

Страница 24: ...PS K K DON T CARE UNDEFINED CQ CQ tCQOH CCQO t tCQOH CCQO t tQVLD QVLD tQVLD Read Latency 2 0 Cycles CLZ t t CO tDOH tCQDOH CQD t tCHZ Q00 Q01 Q20 Q02 Q21 Q03 Q22 Q23 tCQH tCQHCQH Q Notes 31 Q00 refer...

Страница 25: ...all Fine Pitch Ball Grid Array 15 x 17 x 1 4 mm Industrial CY7C1556V18 375BZI CY7C1543V18 375BZI CY7C1545V18 375BZI CY7C1541V18 375BZXI 51 85195 165 Ball Fine Pitch Ball Grid Array 15 x 17 x 1 4 mm Pb...

Страница 26: ...00BZXC CY7C1541V18 300BZI 51 85195 165 Ball Fine Pitch Ball Grid Array 15 x 17 x 1 4 mm Industrial CY7C1556V18 300BZI CY7C1543V18 300BZI CY7C1545V18 300BZI CY7C1541V18 300BZXI 51 85195 165 Ball Fine P...

Страница 27: ...CY7C1545V18 Document Number 001 05389 Rev F Page 27 of 28 Package Diagram Figure 6 165 ball FBGA 15 x 17 x 1 4 mm 51 85195 0 2 2 8 8 8 3 4 0 0 2 2 4 0 6 7 44 6 7 0 2 0 2 3 2 0 490 3 2 3 3 4 3 0 7 4 G...

Страница 28: ...ice to the materials described herein Cypress does not assume any liability arising out of the application or use of any product or circuit described herein Cypress does not authorize its products for...

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