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Evaluation Kit User Manual
EV9000
2001 Consumer Microcircuits Limited
21
UM9000/2
3.2.6 Test
Points
Test points are provided for easy probe access to important circuit nodes. They are described in
Table 13 and their positions indicated in Figure 11. Jumpers, described in Section 3.2.5, also
provide convenient probe points. Note that the DOC pins (TP3, TP4, TP7 and TP8) should not be
monitored directly as they are high impedance points.
Name Channel
Node
Description
TP1 A
Rx
feedback
TP2 A
V
BIAS
output level (not buffered)
TP3
A
DOC2 voltage (buffered)
TP4
A
DOC1 voltage (buffered)
TP5 B
Rx
feedback
TP6 B
V
BIAS
output level (not buffered)
TP7
B
DOC2 voltage (buffered)
TP8
B
DOC1 voltage (buffered)
Table 13: Test Points
Figure 11: Test Point Locations