3
4
TABLE OF CONTENTS
General Safety
General Information
Description
Options
Battery and Charging
Warranty
Connections
Operating
Front Panel
Power On/Off
Center Frequency
Frequency Span
Marker
Hold and Copy
Menus
Backlight
Y
Scale
X
Scale
Time/Date
Info
Settings
Measurements
Specifications
XML Feature
Accessories
Conversion Tables
Abbreviations
4
4
4
4
5
5
5
6
6
7
7
7
8
8
9
9
9
9
9
10
10
11
13
14
16
17
17
GENERAL SAFETY:
SWR TRUE should only be used for its intended purpose and never be con- nected
to cables carrying hazardous voltages.
When handling NiMh batteries great care should be observed preventing polarity
reversal and short circuit as the batteries may explode or catch fire
GENERAL INFORMATION.
Description:
The SWR TRUE instrument is an Antenna Analyzer for analyzing Antennas and
feeder cable VSWR or Return loss. The instrument measure the return loss by using
a Wheatstone RF bridge, a detector and a RF Generator. The control of the entire
instrument is by a microprocessor. The microprocessor is running in a MOP (Micro
Operating Program) environment. The MOP schedule and execute all tasks required
to handle the LCD Screen, the Key- board, The RF generator, USB interface, serial
interface, time of day clock and measurement calculations.
The RF generator covers the frequency range from 30MHz to 2700MHz by using
two PLL generator covering 650MHz to 1450MHz and 1450MHz to 2700MHz. The
low frequency range from 30MHz to 650MHz is covered by mixing the two PLL
generators.
The instrument has a built in time of day clock. This clock is used to identify the
output files going to either USB or serial interface.
Options:
The XML Data option, this option will allow the user to enter specific data into
the instrument regarding Operator name, Location of Object, Type of Object. The
feature will have an XML file viewer or the data could be used in all PC programs
supporting XML data format ( Microsoft, LINUX etc.)
Remote Control, this option will allow the instrument to be controlled by the USB
B type serial interface. The setup going to the instrument and the measurement data
coming from the instrument can be a part of a large test system.
