Basler BE1-51C, Инструкция по эксплуатации

Страница: 64 / 66

BE1-51C Maintenance
7-2
TROUBLESHOOTING
The following resources are available to aid in troubleshooting.
Built-In-Test
The Built-In-Test feature (BIT) is a quick-test routine that is programmed into the firmware of the relay.
When initiated, the relay will automatically perform (at one-second intervals) a series of tests that may be
monitored by the outputs and indicator lamps of the relay. By observing that the sequence ran as specified,
the proper operation of all indicators and outputs, as well as much of the internal digital and analog circuitry,
is verified. (It does not check the input circuitry, however.)
BIT requires isolation of the relay (all outputs disconnected), and withdrawal of the logic circuit board (to
move the TEST/NORMAL switch to the test position). Therefore it is intended as a service bench resource
for troubleshooting, rather than as part of
for example a scheduled, periodic operational test program.
For implementation instructions, see the Service Manual.
Batch Programs
To assist in troubleshooting, the relay may be exercised by a programmed sequence of changing
parameters using a batch program. For instructions and a sample diagnostic program, see Section 4 of the
BEBUS User's Manual (publication 9 2330 00 993).
TIMEKEEPING
The real-time clock within the relay, once set after power up, maintains time to a resolution of 0.01 second;
however, drift within the clock can be as much as 0.5 seconds per day. In order to keep all of the clocks in
the system in proper synchronization, it is suggested that the master station broadcast the correct time at
least once per day.
Note that changing the time within a relay by seconds or minutes can upset instrumentation functions such
as demand calculations.