
MBIST Instruction Register
3-4
Copyright © 2007, 2008 ARM Limited. All rights reserved.
ARM DDI 0402B
3.2
Field descriptions
The following sections describe the MBIR fields:
•
•
•
Read latency and write latency fields, MBIR[44:41] and MBIR[48:45]
•
Y-address and X-address fields, MBIR[36:33] and MBIR[40:37]
•
•
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Column width field, MBIR[10:9]
•
•
•
•
Lockdown by line support field, MBIR[1]
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Way configuration field, MBIR[0]
3.2.1
Pattern field, MBIR[60:55]
The MBIST controller is supplied with industry-standard pattern algorithms and a
bit-line stress algorithm. You can group algorithms together to create a specific memory
test methodology for your product.
Table 3-1 describes the supported algorithms, and
describes their use. The N values in the table indicate the number of RAM accesses per
address location and give an indication of the test time when using that algorithm.
Table 3-1 Pattern field encoding
Pattern
MBIR[60:55]
Algorithm name
N
Description
b000000
Write Solids
1N
Write a solid pattern to memory
b000001
Read Solids
1N
Read a solid pattern from memory
b000010
Write Checkerboard
1N
Write a checkerboard pattern to memory
b000011
Read Checkerboard
1N
Read a checkerboard pattern from memory
b000100
March C+ (x-fast)
14N
March C+ algorithm, incrementing X-address first
b001011
March C+ (y-fast)
14N
March C+ algorithm, incrementing Y-address first
b000101
Fail Pattern
6N
Tests memory failure detection capability
Содержание PL310
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