Functional Description
2-12
Copyright © 2002, 2003 ARM Limited. All rights reserved.
ARM DDI 0275D
2.8
TAP controller
All registers in the ETB11 are programmed through the TAP controller or the AHB
interface. Registers are accessed through scan chain 0. The TAP controller is connected
in series with other TAP controllers on the chip.
The registers described in this section are:
•
•
2.8.1
Test data registers
There are two test data registers that can be connected between
DBGTDI
and
DBGTDO
. They are described in:
•
•
Bypass Register
This is a single bit register that can be selected as the path between
DBGTDI
and
DBGTDO
to enable the device to be bypassed during boundary-scan testing. When the
BYPASS instruction is the current instruction in the instruction register, the SHIFT-DR
state transfers serial data from
DBGTDI
to
DBGTDO
with a delay of one
DBGTCK
cycle. A logic 0 is loaded from the parallel input of the Bypass Register in the
CAPTURE-DR state.
Содержание ETB11
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