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Analysis tools: EZJIT Complete (standard on DSA models)
Discover signal anomalies to the noise of the waveform
More than your standard jitter
package
In order to efficiently determine
root cause for any type of signal
degradation in the amplitude domain,
you must first determine whether
the problem is caused by random
or deterministic sources. In order to
help you accomplish this task, EZJIT
Complete takes analysis techniques
used in the time domain (jitter
analysis) and extends them into the
amplitude domain.
More than just an eye contour
EZJIT Complete is an in-depth view into
impairments related to signal levels –
either logic ones or logic zeroes – deviat-
ing from their ideal positions. Some tools
simply provide a view of an eye contour,
but provide no real measurement data
other than nice graphics.
EZJIT Complete uses separation
techniques to allow each bit to be
examined to determine correlated effects
and to make multiple measurements
on individual bits to determine uncor-
related effects. Use FFTs to analyze the
frequency domain and extract random
components. Dual-Dirac modeling
techniques are also carried from
the jitter domain and used in the
interference domain.
Key measurements
With EZJIT Complete, 90000
X-Series scopes offer the following
unique measurements:
• Total interference (TI)
• Deterministic interference (DI)
• Random noise (RN)
• Periodic interference (PI)
• Inter-symbol interference (ISI)
• RIN (dBm or dB/Hz)
• Q-factor