Advantech WISE-750, Руководство пользователя

Страница: 25 / 44

19 WISE-750 User Manual
C
ha
pte
r 4
D
ev
ice
C
on
fig
ura
tio
n
Device Test
This function allows you to tests all the functions of WISE-750 in terms of signal con -
nection. Each page performs its corresponded functions from analog input, digital
input to digital output. Note that the FFT plot in analog test is transformed from time-
domain data in the computer. It is not transformed by WISE-750 itself.
Figure 4.2 Device Test Page
Feature Extraction
In this page, the function of feature extraction can be set. To activate this page, the
run mode should be set to “Feature Extraction Mode” in Configuration page. The data
logging and alarm criteria could be set in this page. For more information, please
refer to 4.6.2 Feature Extraction Mode.
Figure 4.3 Feature Extraction Page
ML Modeling
The machine learning related functions are all in this page. To activate this page, the
run mode should be set to “Intelligent Mode” in Configuration page. The dataset