Zener Diodes
Publication date: July 2008
SKE00032BED
1
This product complies with RoHS Directive (EU 2002/95/EC).
MAZ8xxxG Series
Silicon planar type
For stabilization of power supply
Features
Extremely low noise voltage caused from the diode (2.4 V to
39V, 1/3 to 1/10 of our conventional MAZ3xxx series)
Extremely good rising performance (in the low-current range)
Easy-to-select the optimum diode because of their
fi
nely divided
zener-voltage ranks
Guaranteed reliability, equivalent to that of conventional products
(Mini type package)
Allowing to reduce the mounting area, thickness and weight
substantially, compared with those of the conventional products
Allowing both re
fl
ow and
fl
ow mode of automatic soldering
Allowing automatic mounting by an existing chip mounter
Absolute Maximum Ratings
T
a
= 25
°
C
Parameter
Symbol
Rating
Unit
Repetitive peak forward current
I
FRM
200
mA
Power dissipation
*
P
D
150
mW
Junction temperature
T
j
150
°
C
Storage temperature
T
stg
–55 to +150
°
C
Note) *: P
D
= 150 mW achieved with a printed circuit board.
Common Electrical Characteristics
T
a
= 25
°
C
±
3
°
C
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Forward voltage
V
F
I
F
= 10 mA
0.9
1.0
V
Zener voltage
*1
V
Z
I
Z
Speci
fi
ed value
V
Zener rise operating resistance
R
ZK
I
Z
Speci
fi
ed value
Refer to the list of the
electrical characteristics
within part numbers
W
Zener operating resistance
R
Z
I
Z
Speci
fi
ed value
W
Reverse current
I
R
V
R
Speci
fi
ed value
m
A
Temperature coef
fi
cient of zener voltage
*2
S
Z
I
Z
Speci
fi
ed value
mV/
°
C
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7031 measuring methods for diodes.
2. Absolute frequency of input and output is 5 MHz.
3. The temperature must be controlled 25
°
C for V
Z
mesurement.
V
Z
value measured at other temperature must be adjusted to V
Z
(25
°
C)
4. *1 : V
Z
guaranted 20 ms after current
fl
ow.
*2 : T
j
= 25
°
C to 150
°
C
Package
Code
SMini2-F3
Pin Name
1: Anode
2: Cathode
Marking symbol
Refer to the list of the electrical
characteristics within part numbers