10 Technical Data and Conformity | 10.3 Declaration of Conformity
ZEISS
10.3 Declaration of Conformity
Denomination
Focused Ion Beam - Scanning Electron Microscope (FIB-SEM)
Model
Crossbeam 350
Manufacturer
Carl Zeiss Microscopy GmbH
Carl-Zeiss-Str. 22
73447 Oberkochen
Germany
We declare under our sole responsibility that the above machinery and the optional accessories
fulfil all the relevant provisions of the following EC Directives:
§
2006/42/EC
– Machinery Directive
§
2014/30/EU
– Electromagnetic Compatibility
Applied harmonized standards:
§
EN ISO 12100:2010
– Safety of machinery – General principles for design – Risk assessment
and risk reduction
§
EN ISO 13849-1:2008
– Safety of machinery – Safety related parts of control systems –
Part 1: General principles for design
§
EN 60204-1:2006
– Safety of machinery – Electrical equipment of machines – Part 1: Gen-
eral requirements
§
EN 61010-1:2010
– Safety requirements for electrical equipment for measurement, control,
and laboratory use
§
EN 61326-1:2013
– Electrical equipment for measurement, control and laboratory use –
EMC requirements – Part 1: General requirements
Electrical Field
The workstation is a class A device (industrial). The workstation is designed to operate in a con-
trolled electromagnetic environment. This means that devices with RF transmitters such as mobile
phones or DECT phones must not be used in close proximity.
CE Marking
The CE conformity marking is located on the type plate of the machinery or the optional acces-
sory, respectively.
Unauthorized modifications of the machinery or the optional accessory will cancel this declara-
tion.
For Korea only
EMC user notice
120
Instruction Manual ZEISS Crossbeam 350 | en-US | Rev. 3 | 349500-8111-000
